Diagnostic Electron Microscopy (EM)

在多种肿瘤和非肿瘤疾病的诊断中，透射式电子显微镜(EM)被用作一种辅助程序，在精心选择的诊断难题中，它是非常有用的。该服务由CAP定期检查和认证，是NIH园区唯一通过CAP认证的诊断EM服务。去年共处理了150宗个案，包括350幢楼宇。提交给我们进行超微结构评估的诊断标本来自NCI/NIH方案治疗的患者，在诊断和科学方面具有挑战性。由于NCI方案的性质，我们通常是第一个描述肿瘤或疾病的不寻常和独特的超微结构发现，或实验性治疗的结果。

Transmission electron microscopy (EM) is used as an adjunct procedure in the diagnosis of a wide range of neoplastic and non neoplastic diseases and can be extremely useful in well chosen diagnostic dilemmas. The service is regularly inspected and certified by CAP, and is the only diagnostic CAP-certified EM service on NIH campus. A total of 150 cases were processed last year, consisting of 350 blocks. The diagnostic specimens that are submitted to our service for ultrastructural evaluation are from patients treated in NCI/NIH protocols and are diagnostically and scientifically challenging. Due to the nature of the NCI protocols, we are often the first to describe the unusual and unique ultrastructural findings of a tumor or disease, or the outcome of experimental treatments.