Energy dispersive X-ray spectrometer for FIBSEM

我们正在为我们最近由麦克马斯特大学购买的聚焦离子束扫描电子显微镜（FIB-SEM）请求能量色散X射线光谱（EDS）检测器。 该分析附件对于分析切片和随后的透射电子显微镜分析所需样品的化学成分至关重要。该工具包括元素绘图和定量软件，对于识别需要分析的相是必不可少的，绘制感兴趣区域的元素分布图，以便确定需要研究的具体区域。项目包括分析用于汽车应用和机加工工具的涂层，合金中的氧化皮和氧化层，生物材料中的界面，蒸汽发生器中压力管的涂层以及微观结构的固化。该工具还将用于开发和验证理论模型与实验数据上获得的测试微结构。如果没有这一所要求的工具，许多研究项目的研究和进展将受到严重限制，数据的可靠性也将受到影响，预计10多个研究小组和大约40名研究生和博士后研究员将受益于这一能力。

We are requesting an energy dispersive X-ray spectrometry (EDS) detector for our focused ion beam scanning electron microscope (FIB-SEM) recently purchased by McMaster University.  This analytical attachment is essential to enable the analysis of the chemical composition of samples that have to be prepared for sectioning and for subsequent transmission electron microscopy analysis.The tool which includes software for elemental mapping and quantification is indispensable for the identification of phases that need to be analysed, to map the distribution of elements in the areas of interest so that specific areas that need to be studied can be identified.Several research groups will benefit from the requested instrument. Projects include the analysis of coatings used for automotive applications and machining tools, scales and oxidation layers in alloys, interfaces in biomaterials, coating in pressure tubes in steam generators, and solidification of microstructures. This tool will also be used to develop and validate theoretical models with experimental data obtained on test microstructures. Without this requested instrument, this research and progress in numerous research projects will be severely limited and the reliability of the data will be compromised.It is expected that over 10 research groups and approximately 40 research students and postdoctoral fellows will benefit from this capability.