Energy dispersive X-ray spectrometer for FIBSEM

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We are requesting an energy dispersive X-ray spectrometry (EDS) detector for our focused ion beam scanning electron microscope (FIB-SEM) recently purchased by McMaster University.  This analytical attachment is essential to enable the analysis of the chemical composition of samples that have to be prepared for sectioning and for subsequent transmission electron microscopy analysis.The tool which includes software for elemental mapping and quantification is indispensable for the identification of phases that need to be analysed, to map the distribution of elements in the areas of interest so that specific areas that need to be studied can be identified.Several research groups will benefit from the requested instrument. Projects include the analysis of coatings used for automotive applications and machining tools, scales and oxidation layers in alloys, interfaces in biomaterials, coating in pressure tubes in steam generators, and solidification of microstructures. This tool will also be used to develop and validate theoretical models with experimental data obtained on test microstructures. Without this requested instrument, this research and progress in numerous research projects will be severely limited and the reliability of the data will be compromised.It is expected that over 10 research groups and approximately 40 research students and postdoctoral fellows will benefit from this capability.