Quantitative X-Ray Microanalysis of Bulk Materials at High Energy (60-400 keV)

高能 (60-400 keV) 散装材料的定量 X 射线微分析

• 批准号: 428435-2011
• 负责人: Gauvin, Raynald
• 金额: $ 3.67万
• 依托单位: McGill University
• 依托单位国家: 加拿大
• 项目类别: Collaborative Research and Development Grants
• 财政年份: 2013
• 资助国家: 加拿大
• 起止时间: 2013-01-01 至 2014-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=532554
• 关键词: Quantitative; Ray; Microanalysis; Bulk; Materials

The objective of this project consists of elaborating a simple, reliable and efficient tool for quantitative x-ray microanalysis of bulk specimen in the transmission electron microscope (TEM) for electron energies from 60 to 400 keV. Such tools do not exist presently. In 2009, Bruker introduced the first Silicon Drift Detector (SDD) that can be installed in a TEM that provides, at least, a photon count rate of 500 000 counts/s with energy resolution similar to Si(Li) EDS detectors. The first SDD detector was installed to the Field Emission Scanning Transmission Electron Microscope (FE-STEM) Hitachi HD-2700 of Hydro-Québec Research Center. It is now possible to acquire x-ray spectra of bulk specimen in the TEM for electron energy above 60 keV. However, quantitative x-ray microanalysis of x-ray spectra acquired for electron energies above 60 keV is not possible because the quantitative models that already exist for bulk specimen were developed for electron beam energy below 30 keV, the electron energies used by the electron microprobe and the SEM. This collaborative research grant is to develop, in collaboration with Bruker and Hydro-Québec, a method to perform quantitative x-ray microanalysis of bulk specimen in the 60 - 400 keV range. It is expected that quantitative x-ray microanalysis of bulk specimen in the TEM will lower the detection limit of trace elements. Finally, comparisons will be performed for the analysis of bulk materials between 30 and 200 keV in order to show the advantages and limitations of these energies for quantitative x-ray microanalysis of bulk specimens.

该项目的目标包括制定一个简单，可靠和有效的工具，用于在透射电子显微镜（TEM）中对电子能量从60到400 keV的体样品进行定量X射线显微分析。 这种工具目前还不存在。2009年，布鲁克公司推出了第一款可安装在TEM中的硅漂移探测器（SDD），其光子计数率至少为500 000计数/秒，能量分辨率与Si（Li）EDS探测器相似。第一个SDD检测器安装在Hydro-Québec研究中心的场发射扫描透射电子显微镜（FE-STEM）Hitachi HD-2700上。现在可以在TEM中获得电子能量超过60 keV的块状样品的X射线谱。然而，定量X射线显微分析的X射线光谱获得的电子能量超过60千电子伏是不可能的，因为定量模型，已经存在的散装试样开发的电子束能量低于30千电子伏，所使用的电子能量的电子探针和SEM。该合作研究基金将与布鲁克公司和魁北克水电公司合作，开发一种在60 - 400 keV范围内对散装样品进行定量X射线微量分析的方法。预计在透射电镜中对块状样品进行定量X射线微区分析将降低痕量元素的检出限。最后，比较将进行散装材料之间的分析30和200千电子伏，以显示这些能量的优点和局限性，定量X射线显微分析散装标本。