Accuracy improvement of near field microwave scanners

本方案旨在为加拿大艾伯塔省卡尔加里市EMSCAN公司解决微波扫描探针的具体问题。2014年10月10日，EMSCAN首席执行官对麦克马斯特大学进行了多次电话讨论和首次访问，EMSCAN和麦克马斯特大学的研究团队确定了短期目标和长期目标，我们能够共同努力改进EMSCAN的产品。本提案旨在解决一个短期目标，即提高EMSCAN生产的微波扫描仪的精度，用于天线测量，电磁干扰（EMI）估计和电磁兼容性（EMC）应用。为了准确预测被测器件的近场和远场特征，探头需要在电场和磁场分量之间具有高选择性。我们将运用我们在伴随灵敏度分析和优化技术方面的专业知识来提高这些扫描仪的准确性。该提案的预期结果将以单个探针和探针阵列的新建议设计的形式交付，这些探针阵列将与EMSCAN使用的扫描仪集成。这些设计将通过硬件验证进行验证。还将提交一份总结优化步骤的完整项目报告。EMSCAN将立即意识到这个项目的经济效益，通过提高他们的扫描仪的准确性，从而提高他们的

This proposal aims at solving a specific problem in microwave scanning using probes for EMSCAN Inc., Calgary, Alberta, Canada. After a number of discussion calls and an initial visit by the CEO of EMSCAN to McMaster University on October 10th, 2014, EMSCAN and the research team in McMaster identified both short term goals and long terms goals that we are able to work in together to improve the products of EMSCAN. This proposal aims at addressing one of the short term goals which is to improve the accuracy of the microwave scanners produced by EMSCAN for antenna measurements, Electromagnetic Interference (EMI) estimation, and Electromagnetic Compatibility (EMC) applications. For accurate prediction of the near and far field signature of the devices under test, the probes need to have high selectivity between electric and magnetic field components. We will apply our expertise in adjoint sensitivity analysis and optimization techniques to improve the accuracy of these scanners. The expected outcome of this proposal will be delivered in the form of new suggested designs of individual probes and of probe arrays to be integrated with the scanners used by EMSCAN. These designs will be verified through hardware verifications. A full project report summarizing the optimization steps will also be delivered. EMSCAN will immediately realize the financial benefits of this project by improving the accuracy of their scanners and thus improving their