Evaluation of impedance spectroscopy as a tool to characterize performance losses in silicon photovoltaics

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New silicon photovoltaic technologies have been developed in recent years, such as PERC (Passivated EmitterRear Contact) cells. New failure mechanisms have appeared for these technologies, such as Light and ElevatedTemperature Induced Degradation (LeTID) and passivation layer degradation. New characterization approachesare therefore required to assess these loss mechanisms during the manufacturing process and in the field. Thisproject will assess impedance spectroscopy as a non-destructive technique to characterize degradationmechanisms and performance losses in the silicon PERC cells and modules manufactured by Canadian SolarInc. Impedance spectroscopy (IS) uses an AC signal with varying frequency to measure the impedance of anelectrical system and determine an equivalent circuit. Changes in the equivalent circuit can be associated withperformance losses and cell degradation. A non destructive technique for identifying specific degradationmechanisms would complement existing techniques and would be used by Canadian Solar Inc. to furtherimprove its manufacturing processes and the quality of the products it can deliver to its customers. This couldtranslate to an increased global market share and expanded employment base in Canada. Importantly,photovoltaics are an environmentally friendly renewable energy source that can help meet Canada's energydemands.