High-Precision non-Invasive Electromagnetic Scanner for Characterizing Circuits & Devices

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As 5G/6G telecommunications systems emerge, complex Electro-Magnetic Structures (EMS) such as phased arrays, MIMO antennas, and reconfigurable intelligent surfaces (RIS) are inevitable to enhance data rate and coverage. It is often difficult and expensive to characterize large or low frequency EMSs in a far field measurement system. Near field measurements allow EMS measurements to be conducted in a smaller anechoic chamber. In addition to identifying the radiating sources, current distributions of radio frequency (RF) elements, and far field pattern of antennas, near-field data can be used to analyze circuit performance and failures. Our existing near-field scanner at the University of Alberta cannot get close to the surface of the device under test (DUT) because its metallic parts disturb the EM fields. It has relatively large probes, limited bandwidth, and coarse spatial resolution (around 100um). This proposal seeks funding to purchase a state-of-the-art Electro-Optic Near-Field Scanner (EONFS). An EONFS will leverage current $2+ million NSERC- and CFI-funded Integrated Circuits, RF/microwave/mm-wave, and antenna-characterization labs and support 30+ HQP. This is a unique system that allows simultaneous noninvasive amplitude and phase measurements at ultra-high sampling resolutions (10um) and frequency bandwidth (1MHz - 40GHz). The EONFS enables probes to be placed very close to the EMS surface, where near-field strength is high. It can eliminate the need for a large anechoic chamber at low frequencies. Using an EONFS, our teams can contribute significantly to three core programs in terms of fundamentals and applications: 1) EM Surfaces and antennas: In order to support emerging 5G/6G and Internet of Things applications, we intend to develop RISs and miniaturized antennas (by measuring near-field sources and mapping equivalent sources, we will be able to optimize the structure and calculate far-field radiation patterns); 2) Integrated Circuits: We are developing integrated circuits to operate phased arrays and antennas on chip (distributed and high-power effects can be detected accurately using nonintrusive near-field probing and on-wafer characterization); 3) Sensors and Optical-Microwave Devices: We intend to develop ultra-sensitive structures and integrated optical-microwave devices for sensing and quantum communication (the large measurement dynamic range, high spatial resolution, and small non-metal probes provide an ideal platform for verifying the model of our novel sensors and optical-microwave devices). An EONFS will benefit a large community of researchers, engineers, and students working on wireless communication and sensing applications who require measurement, characterization, and adjustment of their devices. As 5G/6G technologies continue to develop rapidly, delays in acquiring this equipment will constrain technologically relevant HQP training in our programs, and will adverse affect our ability to attract industrial partners.