High-Precision non-Invasive Electromagnetic Scanner for Characterizing Circuits & Devices

随着5G/6 G电信系统的出现，复杂的电磁结构（EMS），如相控阵列，MIMO天线和可重构智能表面（RIS），不可避免地要提高数据速率和覆盖范围。在远场测量系统中表征大或低频EMS通常是困难且昂贵的。近场测量允许在较小的消声室中进行EMS测量。除了识别辐射源、射频（RF）元件的电流分布和天线的远场模式外，近场数据还可用于分析电路性能和故障。阿尔伯塔大学现有的近场扫描仪无法接近被测器件（DUT）的表面，因为其金属部件会干扰电磁场。它具有相对较大的探头，有限的带宽和粗略的空间分辨率（约100 um）。该提案寻求资金购买最先进的电光近场扫描仪（EONFS）。EONFS将利用目前200多万美元的NSERC和CFI资助的集成电路、RF/微波/毫米波和天线表征实验室，并支持30多个HQP。这是一个独特的系统，允许在超高采样分辨率（10 um）和频率带宽（1 MHz-40 GHz）下同时进行无创幅度和相位测量。EONFS使探头能够非常靠近EMS表面放置，近场强度很高。它可以消除在低频时对大型消声室的需要。使用EONFS，我们的团队可以在基础和应用方面为三个核心项目做出重大贡献：1）EM表面和天线：为了支持新兴的5G/6 G和物联网应用，我们打算开发RIS和小型化天线（通过测量近场源和绘制等效源，我们将能够优化结构并计算远场辐射图）; 2）集成电路：我们正在开发集成电路，以在芯片上操作相控阵和天线（可以使用非侵入式近场探测和晶片上表征来精确地检测分布式和高功率效应）; 3）传感器和光学微波器件：我们打算开发用于传感和量子通信的超灵敏结构和集成光学微波器件（大测量动态范围、高空间分辨率和小型非金属探针为验证我们的新型传感器和光学微波器件的模型提供了理想的平台）。EONFS将使大量从事无线通信和传感应用的研究人员、工程师和学生受益，他们需要对其设备进行测量、表征和调整。随着5G/6 G技术的持续快速发展，延迟采购这些设备将限制我们项目中与技术相关的HQP培训，并将对我们吸引行业合作伙伴的能力产生不利影响。

As 5G/6G telecommunications systems emerge, complex Electro-Magnetic Structures (EMS) such as phased arrays, MIMO antennas, and reconfigurable intelligent surfaces (RIS) are inevitable to enhance data rate and coverage. It is often difficult and expensive to characterize large or low frequency EMSs in a far field measurement system. Near field measurements allow EMS measurements to be conducted in a smaller anechoic chamber. In addition to identifying the radiating sources, current distributions of radio frequency (RF) elements, and far field pattern of antennas, near-field data can be used to analyze circuit performance and failures. Our existing near-field scanner at the University of Alberta cannot get close to the surface of the device under test (DUT) because its metallic parts disturb the EM fields. It has relatively large probes, limited bandwidth, and coarse spatial resolution (around 100um). This proposal seeks funding to purchase a state-of-the-art Electro-Optic Near-Field Scanner (EONFS). An EONFS will leverage current $2+ million NSERC- and CFI-funded Integrated Circuits, RF/microwave/mm-wave, and antenna-characterization labs and support 30+ HQP. This is a unique system that allows simultaneous noninvasive amplitude and phase measurements at ultra-high sampling resolutions (10um) and frequency bandwidth (1MHz - 40GHz). The EONFS enables probes to be placed very close to the EMS surface, where near-field strength is high. It can eliminate the need for a large anechoic chamber at low frequencies. Using an EONFS, our teams can contribute significantly to three core programs in terms of fundamentals and applications: 1) EM Surfaces and antennas: In order to support emerging 5G/6G and Internet of Things applications, we intend to develop RISs and miniaturized antennas (by measuring near-field sources and mapping equivalent sources, we will be able to optimize the structure and calculate far-field radiation patterns); 2) Integrated Circuits: We are developing integrated circuits to operate phased arrays and antennas on chip (distributed and high-power effects can be detected accurately using nonintrusive near-field probing and on-wafer characterization); 3) Sensors and Optical-Microwave Devices: We intend to develop ultra-sensitive structures and integrated optical-microwave devices for sensing and quantum communication (the large measurement dynamic range, high spatial resolution, and small non-metal probes provide an ideal platform for verifying the model of our novel sensors and optical-microwave devices). An EONFS will benefit a large community of researchers, engineers, and students working on wireless communication and sensing applications who require measurement, characterization, and adjustment of their devices. As 5G/6G technologies continue to develop rapidly, delays in acquiring this equipment will constrain technologically relevant HQP training in our programs, and will adverse affect our ability to attract industrial partners.