Magnetic force microscopy with frequency-modulated capacitive tip–sample distance control
Magnetic force microscopy with frequency-modulated capacitive tip–sample distance control
复制标题
具有频率调制电容尖端样本距离控制的磁力显微镜
DOI:
10.1088/1367-2630/aa9ca9
复制
发表时间:
2018
影响因子:
3.3
通讯作者:
Marioni
中科院分区:
文献类型:
--
作者:
Schwenk;Mandru;Penedo;Bacani;Marioni
In a step towards routinely achieving 10 nm spatial resolution with magnetic force microscopy, we have developed a robust method for active tip–sample distance control based on frequency modulation of the cantilever oscillation. It allows us to keep a well-defined tip–sample distance of the order of 10 nm within better than 0.4 nm precision throughout the measurement even in the presence of energy dissipative processes, and is adequate for single-passage non-contact operation in vacuum. The cantilever is excited mechanically in a phase-locked loop to oscillate at constant amplitude on itsfirstflexural resonance mode. This frequency is modulated by an electrostatic force gradient generated by tip–sample bias oscillating from a few hundred Hz up to a few kHz. The sum of the side bands’ amplitudes is a proxy for the tip–sample distance and can be used for tip–sample distance control. This method can also be extended to other scanning probe microscopy techniques.
登录
查看更多内容
DOI:
--
发表时间:
1999
期刊:
影响因子:
--
作者:
R. Proksch;K. Babcock;J. Cleveland
通讯作者:
J. Cleveland
DOI:
--
发表时间:
1998
期刊:
影响因子:
--
作者:
S. Porthun;L. Abelmann;S.J.L. Vellekoop;J. Lodder;H. Hug
通讯作者:
H. Hug
DOI:
--
发表时间:
1992
期刊:
影响因子:
--
作者:
S. Hosaka;A. Kikukawa;Yukio Honda Yukio Honda;Hajime Koyanagi Hajime Koyanagi
通讯作者:
Hajime Koyanagi Hajime Koyanagi
影响因子:
3.5
作者:
S. Rast;U. Gysin;P. Ruff;C. Gerber;Ernst Meyer;Dong
通讯作者:
Dong
影响因子:
8.6
作者:
I. Schmid;M. Marioni;P. Kappenberger;S. Romer;M. Parlińska;H. Hug;O. Hellwig;M. Carey;E. Fullerton
通讯作者:
E. Fullerton