Characterization of Semiconductor Clusters by Four-Wave Mixing and Scanning

随着光波技术的进一步发展，预计微观现象将在新的光学器件的开发中变得更加重要。缩小光学设备尺寸的固有能力是相当大的，这是一个潜力尚未开始实现的领域，尽管一些初步努力是显而易见的。随着维度的缩小，设计和操纵相关物理现象的能力将变得越来越重要。完成这项工作的工具可能会涉及电子显微镜以及X射线、同步辐射和其他潜在的来源。隧道显微镜似乎是这种推力的一个重要方面。它能够描绘微观行为，特别是表面的微观行为，描绘电子行为，以及一般监测晶体结构的能力，提供了一种可能性。将光波技术与扫描电子显微镜领域相结合，研究非线性光学材料，特别是建议中讨论的小维结构，是及时的，并有望导致对未来光学应用具有重要意义的富有成效的研究和技术的发展。建议对所列数额给予为期3年的持续奖励：1987-90,000美元1988-90,000美元1989-90,000美元

As lightwave technology further develops it is anticipated that microscopic phenomena will become more important in the development of new optical devices. The inherent capacity for reducing the size of optical devices is considerable and this is one area in which the potential has not yet begun to be realized, although some initial effort is evident. As dimensions shrink the ability to design and manipulate relevant physical phenomena will become increasingly important. The tools by which this will be done will probably involve electron microscopes as well as x-rays, sychrotron radiation, and other potential sources. Tunneling microscopy appears to be one important aspect of such a thrust. Its ability to portray microscopic behavior particularly of surfaces, to portray electronic behavior, and to generally monitor crystalline structure offers one possibility. The combination of lightwave technology with the field of scanning electron microscopy in a study of nonlinear optical materials and in particular the small dimensional structures discussed in the proposal, are timely and can be expected to lead to fruitful investigations and the development of techniques of future importance to future applications of optics. A 3-year continuing award is recommended for the amounts shown: 1987 - $90,000 1988 - $90,000 1989 - $90,000