Instrumentation for Integrated Circuit Design Laboratory

这项提案需要两台惠普4145B半导体参数分析仪和两台绘图仪，为集成电路设计领域的实验室改进提供基础。实验室改进的目的是引入集成器件和电路表征的现代测量方法，并改进与最近在集成电路设计领域引入的两门课程相关的实验室课程。一门课程侧重于模拟集成电路设计，另一门课程侧重于VLSI子系统的设计和制作。这些课程被放在一起，以提供数字和模拟设计以及MOS和双极技术之间的交叉培养。该设备将用于测量和绘制半导体器件参数和基本电路的特性，如集成电阻、放大器、源、电平移位器、逻辑门和非线性模拟功能电路。将测量器件和电路的输入/输出和传输特性。

This proposal requests two Hewlett Packard 4145B semiconductor parameter analyzers and two plotters provide the base for laboratory improvement in the area of integrated circuit design. The purposes of the laboratory improvement are to introduce modern measurement approaches to integrated device and circuit characterization and to improve the laboratory offerings associated with two recently introduced courses in the integrated circuit design area. One course emphasizes analog integrated circuit design, and the other emphasizes VLSI subsystems design and includes their fabrication. These courses were placed together to provide cross-fertilization between digital and analog design as well as between MOS and bipolar technologies. The equipment will be used to measure and plot semiconductor device parameters and the characteristics of basic circuits such as integrated resistors, amplifiers, sources, level shifters, logic gates, and nonlinear analog functional circuits. Input/output and transfer characteristics will be measured for devices and circuits.