Engineering Research Equipment Grant: Supporting Equipment for Scanning Tip Microscopy

在亚利桑那大学光学科学中心建立了一个扫描尖端显微镜实验室，旨在表征用于非线性光学相互作用的孤立半导体簇。表征设备是光波技术领域制造和应用团队之间的关键纽带，因为它可以根据应用需求定制制造介质。实验室功能包括扫描隧道显微镜（STM），扫描力显微镜（SFM）和近场扫描光学显微镜（NSOM）。购置几件设备将加强这些能力。1. 一般用途：需要一个频谱分析仪来监测在尖端和样品相互作用过程中存在的声学和机械噪声。一台频谱分析仪将服务于六个不同的正在进行的实验。2. 特高压- stm：半导体制造需要克努森源，磁性旋转驱动器传输样品，表面分析需要LEED和螺旋钻。3. 溅射枪及电源。4. 分子模拟计算机。

A scanning tip microscopy laboratory has been established at the Optical Sciences Center, University of Arizona, which aims to characterize isolated semiconductor clusters used for nonlinear optics interactions. The characterization facility is a crucial link between fabrication and application groups working in the field of lightwave technology, because it makes possible tailoring the fabricated media to the applications requirements. The laboratory capabilities include scanning tunneling microscopy (STM), scanning force microscopy (SFM), and near-field scanning optical microscopy (NSOM). Acquisition of several pieces of equipment would enhance these capabilities. 1. General purpose: a spectrum analyzer is needed to monitor the acoustical and mechanical noise that exists during the interaction of the tip and sample. A single spectrum analyzer will serve six different ongoing experimental efforts. 2. UHV-STM: a Knudsen source is needed for semiconductor fabrication, a magnetic rotary drive to transport samples, and a LEED and Auger for surface analysis. 3. Sputtering gun and power supply. 4. Molecular Modeling Computer.