On-Chip Transform IR Spectroscopy by Superconducting Detector Arrays With a Graded Interference Filter

小企业创新研究（SBIR）第一阶段项目 在一般领域仪器仪表的发展， 红外光谱法。 红外（IR）常规方法 光谱学利用小通量（IR通量）光学 用于分散的元件跟随检测器（或阵列），或大的 在整个过程中，扫描干涉仪，然后是检测器。 一 本文提出了一种新的智能探测器设计， 直接在检测器上的红外光变换光谱 芯片本身 新方法是一种大吞吐量的变换 该技术结合了多路复用的优点， 需要机械扫描干涉仪。 这个新 光谱仪可能非常小、紧凑和坚固， 特别是如果它是在硅晶片衬底上制造的， 被计划（即，芯片上的分光计）。 这个光- 电子器件结构也可以适用于其他IR 仪器技术。 在第一阶段项目中， 调查人员将对整个设计进行第一次循环， 分级干涉滤光光谱仪的概念试验 设备. 这种新的红外变换装置的概念 光谱学产生于几个领域的实力， 高级燃料研究公司的研究人员，因此 成功的潜力很大。

This Small Business Innovation Research (SBIR) Phase I project is in the general area instrumentation development in the subfield of infrared spectrometry. Conventional methods of infrared (IR) spectroscopy utilize either a small throughout (IR flux) optical element for dispersion followed a detector (or array), or a large throughout, scanning interferometer followed by a detector. A new, smart detector design is proposed here for accomplishing transform spectroscopy of infrared light directly on the detector chip itself. The new method is a large throughput transform technique which incorporates the multiplex advantage without requiring a mechanically scanned interferometer. This new spectrometer is potentially very small, compact, and rugged, especially if it is fabricated on a silicon wafer substrate, as is planned (i.e., a spectrometer on a chip). This opto- electronic device structure can also be adapted to other IR instrument technologies. During this Phase I project these investigators will make a first loop on the full design and concept testing for the graded interference-filter spectrometer device. The concept for this new device for IR transform spectroscopy arises out of several areas of strength within the research staff at Advanced Fuel Research, Inc., hence the potential for success is large.