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The Structure of Surfaces

The Structure of Surfaces
表面的结构
批准号:
9214054
负责人:
S.Y. Tong
金额:
$24.0万
依托单位国家:
美国
项目类别:
Continuing Grant
财政年份:
1992
资助国家:
美国
项目状态:
已结题
起止时间:
1992-08-01 至 2000-04-30
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中文摘要
翻译
表面和界面结构的定量知识是解决许多重要科学问题的基础。研究将使用多种散射方法来分析对材料的短程和远程顺序敏感的衍射光谱数据。特别是,将开发结构确定的直接方法。发展反衍射图样的方法以产生直接的结构信息是结构分析的长期目标。将研究在实际空间中产生原子分辨率的直接方法。分析和数值研究将与实验程序紧密结合。这项研究的目的是开发复杂的方法,从衍射数据中提取原子的位置信息。这是一个极其重要的项目,与世界各地的各种实验项目密切相关。在充分了解表面、界面和大块固体之前,我们必须知道原子在哪里以及它们在各种外部刺激下的行为。实现这一目标的技术之一是电子全息术。
英文摘要
Quantitative knowledge of the structure of surfaces and interfaces is fundamental to the resolution of a host of important scientific questions. Research will be conducted using multiple scattering methods to analyze data from diffraction spectroscopies sensitive to short-range and long-range order in materials. In particular, development of direct methods for structural determination will be undertaken. It is a long-standing goal of structural analysis to develop methods to invert diffraction patterns to produce direct structural information. Direct methods which produce atomic resolution in real space will be investigated. Analytical and numerical studies will be closely coupled to experimental programs. %%% The goal of this research is to develop sophisticated methods to extract information about the positions of atoms at atomic resolutions from diffraction data. This is an extremely important program and is closely coupled to various experimental programs throughout the world. Before full understanding of surfaces, interfaces and bulk solids can be obtained, we must know where the atoms are and how they behave under various external stimuli. One of the techniques used to achieve this is electron holography.
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Determination of Surface and Interface Structures by Local and Long-Range Order Diffraction Techniques
  • 批准号:
    8805938
  • 项目类别:
    Continuing Grant
  • 资助金额:
    $22.35万
  • 财政年份:
    1988
  • 负责人:
    S.Y. Tong
  • 依托单位:
Photoemission Studies of Adsorbates on Disordered and Stepped Surfaces
  • 批准号:
    8101203
  • 项目类别:
    Continuing Grant
  • 资助金额:
    $17.75万
  • 财政年份:
    1981
  • 负责人:
    S.Y. Tong
  • 依托单位:
Surface Crystallography and Electronic Structure of Metals And Semiconductors
  • 批准号:
    7728112
  • 项目类别:
    Continuing Grant
  • 资助金额:
    $14.2万
  • 财政年份:
    1978
  • 负责人:
    S.Y. Tong
  • 依托单位:
Perturbation Forulation of Low-Energy Electron Diffraction
  • 批准号:
    7302614
  • 项目类别:
    Standard Grant
  • 资助金额:
    $8.9万
  • 财政年份:
    1973
  • 负责人:
    S.Y. Tong
  • 依托单位:
海外基金