Development of an HREELS Analysis System for the Study of Polymers, Semiconductors, and Metal-Oxides

本项目旨在开发配备最新一代高分辨率电子能量损失（HREEL）光谱仪的表面分析系统。该仪器能够在固定的能量分辨率下增加至少20倍的信号，与其他可用的光谱仪相比，能量分辨率提高5倍。这些改进将使HREELS能够应用于各种技术重要材料的表面和界面的振动特性表征，包括聚合物，半导体和金属氧化物，在一个新的细节水平上。该光谱仪最初将用于的项目包括聚合物表面和界面的分子表征、半导体表面和界面动力学以及金属氧化物表面的反应性。

This project is for the development of a surface analysis system equipped with latest generation high resolution electron energy loss (HREEL) spectrometer. This instrument is capable of an increased signal of at least 20 times for a fixed energy resolution and 5 times better energy resolution compared to other available spectrometers. These improvements will allow HREELS to be applied to the characterization of the vibrational properties of the surfaces and interfaces of a variety of technologically important materials, including, polymers, semiconductors, and metal oxides, at a new level of detail. The projects for which the spectrometer will initially be used include the molecular characterization of polymer surfaces and interfaces, semiconductor surface and interface dynamics, and reactivity of metal oxide surfaces.