Development of Planar Microwave Devices for Microwave Resonance Measurements of Sub-Micron Samples

小行星9317338 技术摘要：标准的光刻技术将被用来构建一个平面微波设备，这将是能够测量微波共振信号的磁性薄膜的0.1 × 0.1微米2的探针面积。 目前的操作装置探测面积为100 × 100微米2。 将在标准金属膜上进行作为探针尺寸的函数的微波共振光谱的测量。 预计这些装置将是有用的磁性薄膜和多层膜，细粉，和单磁畴的研究。 许多有趣的磁现象发生在非常小的尺度上（小于1/1000毫米）。 这些通常与结构小的物体有关，例如细粉末，但也包括微观磁性现象。 标准的磁性表征技术只能确定平均性质。 建议建造和测试一个能够在1/1000 mm的尺度上进行磁性测量的设备。 该装置将用于研究各种薄膜以及磁性粉末。 ***

9317338 Vittoria Technical abstract: Standard lithographic techniques will be used to construct a planar microwave device which will be capable of measuring microwave resonance signals over a probe area of 0.1 x 0.1 micron2 of a magnetic thin film. Current operational devices probe areas of 100 x 100 micron2. Measurements of the microwave resonance spectra as a function of probe size will be performed on standard metal films. It is expected that these devices will be useful for the study of magnetic thin films and multilayers, fine powders, and single magnetic domains. Non-technical abstract: Many interesting magnetic phenomena occur on a very small (less than 1/1000 of a millimeter) scale. These are often related to structurally small objects such as fine powders but also include microscopic magnetic phenomena. Standard magnetic characterization techniques can determine only an average property. It is proposed to build and test a device which will be capable of performing magnetic measurements on a scale of 1/1000mm. The device will be useful for studying a variety of thin films as well as magnetic powders. ***