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Acquisition of a Field Emission Scanning Microscope with Automated Orientation

Acquisition of a Field Emission Scanning Microscope with Automated Orientation
获得具有自动定向功能的场发射扫描显微镜
批准号:
9512579
负责人:
Thomas Kelly
金额:
$37.0万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
1995
资助国家:
美国
项目状态:
已结题
起止时间:
1995-09-01 至 1997-08-31

项目摘要

项目成果

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中文摘要
翻译
9512579凯利将获得一台高分辨率场发射扫描电子显微镜,并安装在威斯康星大学麦迪逊校区的材料科学中心。拟议的FESEM有两个特点,使其成为推动材料科学几个领域的基本工具。首先,高图像分辨率使研究纳米尺度(1.2纳米以上)的微结构特征和检查大样本区域成为可能。这使得研究那些很难制备成透射电子显微镜的材料成为可能。高分辨能力将被用来研究高临界电流超导体、离子注入表面的微结构以及纳米陶瓷的微结构。其次,该仪器配备了电子背散射衍射图(EBSP)检测和分析系统,使确定样品中单个颗粒的取向成为可能。这种能力将被用来绘制高温超导体中的颗粒取向图,并可以提供这些材料中关键电流路径的信息。高分辨率扫描电子显微镜将服务于校园内的几个研究小组,研究与材料相关的问题。它取代了一台分辨率低五倍、已有18年历史的仪器。新仪器以高分辨率对大样本成像的能力将使先进材料的常规表征成为可能,并将影响材料科学中正在进行的广泛计划。***
英文摘要
9512579 Kelly A high resolution field-emission scanning electron microscope (FESEM) will be acquired and installed at the Materials Science Center of the University of Wisconsin, Madison campus. The proposed FESEM has two features that make it an essential tool for advancing several areas in materials science. First, the high image resolution capability makes it possible to study microstructural features at the nanometer scale (above 1.2 nanometers) and to examine large sample areas. This allows for the study of materials that are difficult to prepare for transmission electron microscopy (TEM). The high resolution capability will be used to study the microstructure of high critical current superconductors, of surfaces modified by ion implantation, and of nanocrystalline ceramics. Second, the instrument is equipped with an electron backscatter diffraction pattern (EBSP) detection and analysis system which makes possible the determination of the orientation of individual grains in a sample. This capability will be used to map the grain orientation in high temperature superconductors and can provide information on the critical current path in these materials. %%% The high resolution scanning electron microscope will serve several research groups on campus working in materials related problems. It replaces an instrument which has five times lower resolution and which is eighteen years old. The new instrument's ability to image large samples at high resolution will make possible routine characterization of advanced materials and will impact a broad range of ongoing programs in materials science. ***
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Randomness in High-Dimensional Combinatorics: Colorings, Robustness, and Statistics
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