Thermal Probing of Novel Devices, Nanostructures and Interfaces

摘要马琼达9625812介绍了扫描热显微技术的基本发展，以及该技术在各种电子设备和接口中的微尺度热传输方面的应用。目标是在温度测量中获得1-10 nm的空间分辨率和10 ns的时间分辨率。将尝试对自组装导电聚合物和聚合物发光器件进行热探测。此外，还计划对垂直腔面发射激光器和相关量子结构的界面进行温度测量。扫描热显微镜还将应用于固体-固体界面的可靠性研究，如硅上的钻石。

ABSTRACT Majumdar 9625812 Fundamental development of scanning thermal microscopy and application of the technique to microscale heat transport in a variety of electronic devices and interfaces is proposed. The goal is to obtain a spatial resolution of 1-10 nm and a temporal resolution of 10 ns in temperature measurement. Thermal probing of self-assembled conducting polymers and polymeric light-emitting devices will be attemped. In addition, temperature measurements of vertical cavity surface emitting lasers and interfaces of related quantum structures are planned. The scanning thermal microscope will also be applied to reliability studies of solid-solid interfaces, such as diamond on silicon.