Built-In Test Mechanisms and Embedded Cores

9815229这个项目是亚利桑那大学（Tragoudas）和南伊利诺伊大学卡本代尔分校（Kagaris）的合作项目。这个项目正在探索一个框架，用于设计易于测试的内核。该方法基于识别核心中不相交的组件的能力，这些组件称为cc（核心组件），没有发布实现细节。为核心的其余部分提供网表信息。CCs必须保证预先设计的堆芯知识产权得到保护，并简化测试过程。功能故障是通过使用内置自测（BIST）或扫描技术对每个CC进行隔离测试来检测的。随后，使用扫描技术对核心的剩余部分进行测试，同时绕过cc。路径延迟故障可能需要对所选cc进行功能级别的测试。正在研究的问题是：(1)确定CC的数量、大小、位置以及每个CC内内置测试机制的类型。(2)开发有助于在核心内生成CC的BIST方案和DFT方法。

9815229This project is a cooperative between the University of Arizona (Tragoudas) and Southern illinois University at Carbondale (Kagaris).This project is exploring a framework for designing easily testable cores. The method is based on the ability to identify disjoint components in the core, called CCs (core components),for which no implementation details are released. Netlist information is provided for the remaining portion of the core. The CCs must guarantee that the predesigned intellectual property of the core is protected and that the testing process is simplified. Functional faults are detected by initially testing each CC in isolation using either Built-In Self-Testing (BIST) or scan techniques. Subsequently, the remaining portion of the core is tested using scan techniques while bypassing the CCs. Path delay faults may require functional level testing for the selected CCs. Problems being investigated are: (1) Determining the number, sizes, locations of the CCs, and the type of Built-In Test mechanism within each CC. (2) Developing BIST schemes and DFT methodologies that assist in generating the CCs within the core.