Acquisition of an Atomic Force Microscope for Research and Education

这个奖将为获得原子力显微镜提供部分支持。它将用于正在进行的旨在确定有机材料结构-性质关系的实验。该显微镜具有多种成像和测量模式，将用于探测(1)有机半导体纳米结构的电子特性和(2)单个分子之间化学键的机械强度。这些基础研究的结果将有助于从分子水平上理解有机材料中的电荷输运和纳米力学过程，并有可能对这些材料在薄膜电子等实际应用中的应用产生重大影响。该仪器也将用于教育许多本科生和研究生扫描探针显微镜方法的材料研究。***该仪器将显著提高表征有机材料的机械和电子特性的能力，并将用于培训学生。

9975688FrisbieThis award will provide partial support for the acquisition of an atomic force microscope. It will be used for ongoing experiments aimed at determining structure-property relationships in organic materials. The microscope is capable of a variety of imaging and measurement modes and will be used to probe (1) the electronic properties of well-defined nanostructures of organic semiconductors and (2) the mechanical strength of chemical bonds between individual molecules. The results of these fundamental studies will contribute to molecular level understanding of charge transport and nanomechanical processes in organic materials, and have the potential to significantly impact efforts to use these materials in practical applications such as thin film electronics.This instrument will also be used to educate many undergraduate and graduate students in scanning probe microscopy methods for materials research.***This instrument will significantly enhance the capability to characterize the mechanical and electronic properties of organic materials and will be used to train students.