Nanoprobing Electrical Properties of Organic Semiconductors and Molecular Assemblies

有机半导体和分子组装体的纳米探测电学性质

• 批准号: 0084404
• 负责人: Daniel Frisbie
• 金额: $ 40万
• 依托单位: University of Minnesota-Twin Cities
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2000
• 资助国家: 美国
• 起止时间: 2000-11-01 至 2003-10-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0084404&HistoricalAwards=false
• 关键词: Nanoprobing; Electrical; Properties; Organic; Semiconductors

0084404FrisbieThese projects exploit the atomic force microscope (AFM) to measure electrical potentials and current-voltage characteristics of materials with high spatial resolution. The work focuses on organic semiconductors and self-assembled monolayers (SAMs). The first project, Kelvin Probe Force Microscopy (KPFM) of metal-organic semiconductor interfaces and operating organic field effect transistors (OFETs), employs metal-coated AFM tips to sense surface potentials. Frisbie will use KPFM to measure the contact potential difference (CPD) at metal-organic interfaces to determine the extent of interfacial charge-transfer. He will also use KPFM to map voltage 'drops' in operating OFETs to determine the bottlenecks to electrical transport in these devices. These KPFM studies will quantify the importance of film microstructure and metal-organic interfaces to organic semiconductor transport.The second project, fabrication and electrical characterization of metal-molecule-metal junctions, will use conducting AFM tips to contact single monolayers of molecules assembled on surfaces. The objective of these studies is to characterize transport in molecules as a function of bonding and functional group architecture.It is expected that fundamental understanding stemming from this work about the roles of microstructure, metal-organic interfaces, and molecular architecture on transport will impact efforts to improve electronic devices based on molecular films. These studies involve training of graduate students in the areas of organic thin film electronics, transport physics, and scanning probe microscopy, all of which are areas of high interest to industry.

这些项目利用原子力显微镜（AFM）以高空间分辨率测量材料的电势和电流-电压特性。工作重点是有机半导体和自组装单层（SAMs）。第一个项目是金属-有机半导体界面和操作有机场效应晶体管（ofet）的开尔文探针力显微镜（KPFM），它采用金属涂层AFM尖端来检测表面电位。Frisbie将使用KPFM来测量金属-有机界面的接触电位差（CPD），以确定界面电荷转移的程度。他还将使用KPFM来绘制操作ofet中的电压“降”，以确定这些设备中电传输的瓶颈。这些KPFM研究将量化薄膜微观结构和金属-有机界面对有机半导体输运的重要性。第二个项目，金属-分子-金属结的制造和电学特性，将使用导电AFM尖端来接触组装在表面上的单层分子。这些研究的目的是表征分子中的转运作为键和官能团结构的功能。人们期望，从这项工作中产生的关于微观结构、金属有机界面和分子结构在传输中的作用的基本理解将影响改进基于分子膜的电子器件的努力。这些研究包括在有机薄膜电子学、输运物理学和扫描探针显微镜等领域培养研究生，这些领域都是工业界高度感兴趣的领域。