Non-Contacting Sampled - Line Reflectometers for In-Situ Measurement of Microwave and Millimeter-Wave Circuit Modules

本项目的目的是研究和开发一种新的方法，用于集成微波和毫米波电路模块的非侵入性测量和表征。特别是，这项工作旨在解决当前与测量和表征高频子系统相关的困难和挑战，这些子系统与单个电路板或芯片上的其他组件集成在一起。该计划的最终目标是开发一种非接触式网络分析仪，用于直接，现场测量集成或片上微波和毫米波子系统的散射参数。本项目的研究工作包括完善和应用器件和集成电路处理技术，开发全集成的网络分析仪采样电路，建立非接触式测量方案的校准标准和程序，以及研究、设计和演示用于s参数测量的非接触式反射计。这些活动将直接解决和影响美国国家科学基金会制定的价值评估标准：(1)这个项目的智力价值在于它有可能显著扩展和改进目前用于高频集成电路的测量和诊断能力。这不仅有利于微波测量界，而且将对依赖毫米波和亚毫米波仪器的所有领域产生重大影响。(2)研究高频集成系统的研究人员以及弗吉尼亚大学和其他机构的学生、研究人员和教职员工将感受到这项拟议工作的广泛影响。通过该计划开发的仪器将增强和补充PI的研究和教学实验室的能力，而研究生和本科生的密切参与和参与将对支持大学的教育使命至关重要，并为将这项工作纳入现有课程提供了途径。此外，通过目前与其他机构的合作，该项目开发的技术成果将直接分享和传播给依赖毫米波和亚毫米波系统的社区。该项目最终将演示一个完全集成的非接触参数测量系统，该系统工作在毫米波范围内，可扩展到亚毫米波频谱的频率

0300086WeikleThe objective of this project is to investigate and develop a new approach for the non-invasive measurement and characterization of integrated microwave and millimeter-wave circuit modules. This work, in particular, aims to address present-day difficulties and challenges associated with measuring and characterizing high-frequency subsystems that are integrated with other components on a single circuit board or chip. The ultimate goal of this program is the development of a non-contacting network analyzer for the direct, in-situ measurement of scattering parameters of integrated or on-chip microwave and millimeter-wave subsystems.The research activities to be undertaken during this project will include the refinement and application of device and IC processing technologies to the development of fully-integrated network analyzer sampling circuits, the establishment of calibration standards and procedures for non-contacting measurement schemes, and the investigation, design, and demonstration of non-contacting reflectometers for s-parameter measurements. These activities will directly address and impact the merit review criteria set forth by the National Science Foundation:(1)The intellectual merit of this project lies in its potential to significantly expandand improve the measurement and diagnostic capabilities currently employedfor high-frequency integrated circuits. This will not only benefit the microwavemeasurements community but will significantly impact all fields that rely onmillimeter and submillimeter-wave instrumentation.(2)The broad impact of this proposed work will be felt by researchers working onhigh-frequency integrated systems as well as students, researchers, and facultyat the University of Virginia and other institutions. The instrumentation de-veloped through this program will enhance and complement the capabilities ofthe PI's research and teaching laboratories while the close involvement and partici-pation of graduate and undergraduate students will be crucial to supporting theeducational mission of the university and provide an avenue for incorporatingthis work into the existing curriculum. In addition, through current collabora-tive work with other institutions, the technical achievements developed from thisprogram will be shared and disseminated directly to the communities that relyon millimeter and submillimeter-wave systems.The program will culminate with the demonstration of a fully-integrated non-contactings-parameter measurement system operating in the millimeter-wave range and scalable to frequencies reaching into the submillimeter spectrum