Acquisition of a Scanning Probe System for Characterization of Nanostructure Properties

这笔拨款为购置多用途超高真空扫描隧道显微镜（UHV） STM-AFM提供资金，该显微镜具有全光谱能力，温度范围可延伸至25K。这种设备对大量的纳米科学研究至关重要。该系统包括由制造商和研究人员提供的几个独特的升级。包括先进的表面制备，纳米结构的形成，和表面表征能力。STM-AFM将用于研究探索量子点和线电子学、纳米级肖特基势垒、分子自组装纳米结构中的量子效应、原子定制表面上的选择性反应、纳米级摩擦化学、纳米晶体半导体、压电和铁电纳米图案薄膜、氮化纳米结构的光学发射和光诱导输运效应。扫描探针系统在纳米尺度上测量材料特性的能力是独一无二的。STM本身是基于量子力学隧道来构建原子尺度分辨率的图像。当与扫描隧道光谱技术相结合时，STM的价值大大增加。表面的图像可以从原子尺度的尖与表面之间的吸引和排斥相互作用中构造出来。这项技术被称为原子力显微镜（AFM），在记录地形成像的同时，通过尖端耦合的电测量大大增强了。可变温度扫描探针系统将与另外两个扫描探针系统集成，建立一个纳米结构特性表征实验室。该实验室每年将为30多名学生和博士后研究人员提供参与纳米科学研究和探索性教育项目的机会。此外，从实验室的结果将直接纳入研究生和本科课程，目前在北卡罗莱纳州提供。通过从代表性不足的群体中招募研究生，参与北卡罗来纳州立大学REU项目，以及与附近的北卡罗来纳中央大学和肖大学（两所hbcu）的教师合作，pi一直在积极建立多样性，这些项目有不同学生参与的传统。

This grant provides funding for the acquisition of a multipurpose ultra high vacuum scanning tunneling microscope (UHV) STM-AFM with full spectroscopic capabilities and a temperature range extending down to 25K. This equipment is critical for a multitude of nanoscience studies. The system includes several unique upgrades provided by both the manufacturer and the researchers. Included are advanced surface preparation, nanostructure formation, and surface characterization capabilities. The STM-AFM will be used in research to explore quantum dot and wire electronics and nanoscale Schottky barriers, quantum effects in molecular self-assembled nanostructures, selective reactions on atomically tailored surfaces, tribochemistry at the nanoscale, nanocrystalline semiconductors, piezoelectric and ferroelectric nanopatterned films, optical emission from nitride nanostructures, and light-induced transport effects. Scanning probe systems are unique in their ability to measure materials properties at the nanometer scale. The STM is itself based on quantum mechanical tunneling to construct images with atomic scale resolution. The value of STM is increased substantially when coupled with scanning tunneling spectroscopy techniques. Images of surfaces can be constructed from the atomic scale attractive and repulsive interactions between a sharp tip and a surface. This technique, termed atomic force microscopy (AFM), is substantially enhanced with electrical measurements coupled through the tip at the same time as topographic imaging is recorded. The variable temperature scanning probe system will be integrated with two other scanning probe systems to establish a laboratory for the Characterization of Nanostructure Properties. This laboratory will provide the opportunity for over thirty students and post doctoral researchers annually to be involved with research and exploratory education projects in nanoscience research. Moreover, results from the laboratory will be incorporated directly into graduate and undergraduate courses now being offered at NC State. The PIs have been active in building diversity through their recruiting of graduate students from underrepresented groups, their involvement in the NC State REU programs, which have a tradition of diverse student involvement, and through collaborations with faculty of nearby North Carolina Central University and Shaw University, both HBCUs.