MRI: Acquisition of a Small-Angle X-Ray Scattering/Wide-Angle X-Ray Diffraction (SAXS/WAXD) System for the Characterization of Nanostructured Materials

0923107 MooreVPI&amp；SU技术总结：小角x射线散射/广角x射线衍射(SAXS/WAXD)的同步小角x射线散射/广角x射线衍射(SAXS/WAXD)是对材料内部局部有序的选区电子显微镜的必要补充，它在从液体到固体的更广泛的样品状态范围内，在大范围的长度尺度上探测块状、纳米尺度的形貌方面提供了更全球化的视角。这项提议涉及购买、安装和实施最先进的、高分辨率、3针孔准直的同步SAXS/WAXD仪器，该仪器具有附加的掠入射能力，用于有序表面的结构分析。建议的仪器是必要的，以填补我们在弗吉尼亚理工大学纳米结构表征能力方面的关键空白，以支持我们与大分子和界面研究所(MII)相关的聚合物活动、NSF赞助的各种有源纳米结构计划、国防部和能源部赞助的计划，以及我们新成立的Ictas纳米尺度表征和制造实验室所开展的活动。鉴于这一稀有仪器提供的广泛的多功能性形态实验，我们的多学科研究工作将涉及纳米结构体系的结构分析，范围从生物聚合物复合体的水溶液、胶体悬浮液到用于能源应用和水净化的固态膜、结构可控的半结晶聚合物和混合物、定制的纳米复合材料以及自组装表面结构。拟议的SAXS/WAXD仪器将成为我们的多用户纳米尺度表征和制造实验室的基石系统，并将促进机构和国内/国际合作(学术界和工业界之间)，作为纳米结构材料的形态分析中心。随着相关的理论和实践培训，这一新的能力将开放，以加强不同群体的学生和研究人员的科学和工程努力。外行人摘要：小角X射线散射是一种用于测量固体材料和复杂溶液的内部结构和形状(纳米尺寸)的方法，方法是用一束细小的X射线照射复杂的样品，并用放置在离样品很远的距离处的灵敏探测器捕获散射的X射线的投影。联邦资助和工业赞助的与这一拟议文书相关的研究项目将涉及各种新材料的结构特征，这些新材料将影响从开发高效的能源转换设备到解决现代社会关键健康问题所需的生物功能材料的各种活动。这些新颖的研究活动中的每一个都需要用最先进的SAXS/WAXD方法获得的结构信息，以便从根本上洞察形态-性质关系，这将推动用于各种技术应用的下一代纳米结构材料的发展。拟议的SAXS/WAXD仪器将成为我们多用户纳米尺度表征和制造实验室的基石系统，并将促进(学术界和工业界)作为纳米结构材料形态分析中心的合作。随着相关的理论和实践培训，这一新的能力将开放，以加强不同群体的学生和研究人员的科学和工程努力。

0923107MooreVPI & SUTechnical Summary: As an essential compliment to select-area, electron microscopy of local order within materials, simultaneous small-angle x-ray scattering/wide-angle x-ray diffraction (SAXS/WAXD) offers a more global perspective in its ability to probe bulk, nanoscale morphologies over a wide range of length-scales, within a broader range of sample states from liquids to solids. This proposal involves the acquisition, installation and implementation of a state-of-the-art, high-resolution, 3-pinhole collimated, simultaneous SAXS/WAXD instrument with an added capability of grazing incidence for the structural analysis of ordered surfaces. The proposed instrument is necessary to fill a critical void in our nanostructure characterization capabilities at Virginia Tech in support of our polymer-related activities associated with the Macromolecules and Interfaces Institute (MII), a variety of NSF sponsored programs in active nanostructures, DOD and DOE-sponsored programs, and activities stemming from our newly established ICTAS Nanoscale Characterization and Fabrication Laboratory. Given the broad versatility of morphological experiments available with this rare instrument, our multidisciplinary research efforts will involve structural analysis of nanostructured systems ranging from aqueous, colloidal suspensions of biopolymer complexes to solid-state membranes for energy applications and water purification, structurally-controlled semi-crystalline polymers and blends, tailored nanocomposite materials, and self-assembled surface structures. The proposed SAXS/WAXD instrument will be a cornerstone system in our multi-user Nanoscale Characterization and Fabrication Laboratory, and will stimulate institutional and national/international collaborations (among academia and industry) as a center for morphological analysis of nanostructured materials. Along with associated theoretical and practical training, this new capability will be open to enhance the science and engineering efforts of a diverse population of students and researchers. Layman Summary: Small-angle x-ray scattering is a method used to measure the internal structure and form (in the dimension of nanometers) of solid materials and complex solutions by irradiating a complex sample with a fine beam of x-rays and capturing a projection of the scattered x-rays with a sensitive detector placed at a significant distance from the sample. Federally-funded and industrially-sponsored research projects associated with this proposed instrument will involve structural characterization of a wide variety of new materials that will impact activities ranging from the development of efficient, energy conversion devices to bio-functional materials needed to address critical health issues in our modern society. Each of these novel research activities requires the structural information obtainable with state-of-the-art SAXS/WAXD methods in order to gain fundamental insight into morphology-property relationships that will drive the development of the next generation of nanostructured materials for a variety of technological applications. The proposed SAXS/WAXD instrument will be a cornerstone system in our multi-user Nanoscale Characterization and Fabrication Laboratory, and will stimulate collaborations (among academia and industry) as a center for morphological analysis of nanostructured materials. Along with associated theoretical and practical training, this new capability will be open to enhance the science and engineering efforts of a diverse population of students and researchers.