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CAREER: Investigating the Impact of Device Aging on the Security of Cryptographic Chips

CAREER: Investigating the Impact of Device Aging on the Security of Cryptographic Chips
职业:研究设备老化对加密芯片安全性的影响
批准号:
1943224
负责人:
Naghmeh Karimi
金额:
$49.97万
依托单位国家:
美国
项目类别:
Continuing Grant
财政年份:
2020
资助国家:
美国
项目状态:
未结题
起止时间:
2020-07-01 至 2025-06-30

项目摘要

项目成果

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中文摘要
翻译
密码芯片在硬件中实现密码功能,以获得更好的性能。尽管密码芯片具有显著的性能优势,但攻击者可以通过监控其功耗、篡改其逻辑或将芯片置于压力之下来生成错误输出来推断敏感数据,从而使其受到威胁。当前针对此类攻击的保护没有考虑设备老化,因为设备老化会导致设备参数随时间发生参数变化。设备老化可能会潜在地危及设备安全。这个项目将调查设备老化对加密设备安全的影响。该项目的目标是了解与老化相关的风险,这些风险危及加密设备的安全,特别是那些具有物理攻击保护的设备,并开发解决方案,以确保设备老化时的安全性。本项目将重点关注以下威胁并调查老化如何影响它们:(I)最先进的侧通道分析攻击;(Ii)最先进的故障注入攻击;以及(Iii)由于老化可以促进/强化激活的硬件特洛伊木马。它将针对这些方案的缺点,开发具有老化弹性的对策,以绕过侧通道和故障注入攻击。该项目还将研究老化感知特洛伊木马检测解决方案。该项目的成功将使可信硬件平台的长期安全开发成为可能,并导致抗老化安全解决方案通过设备在其生命周期中保持安全而造福社会。为了吸引研究生、本科生和代表性不足的学生参加硬件安全和密码学的研究和教育,该项目将开发一门关于密码学、硬件安全和测试的新课程。将进行教程,并将为本科生提供硬件安全实习机会。该项目还将寻求吸引代表性不足的少数群体。将为Cristo Rey耶稣会高中生组织关于硬件安全的讲座。项目库将以电子方式存储,并通过马里兰大学巴尔的摩县大学计算机科学和电气工程系(https://www.csee.umbc.edu/~nkarimi/).)托管的网站提供这些数据将在资助期结束后保留至少五年。这一奖项反映了NSF的法定使命,并通过使用基金会的智力优势和更广泛的影响审查标准进行评估,被认为值得支持。
英文摘要
Cryptographic chips implement cryptographic functions in hardware for better performance. Despite the significant performance benefits, cryptographic chips can be compromised by the adversaries via monitoring their power-consumption, tampering their logic or placing the chips under stress to generate erroneous outputs to infer sensitive data. The current protections against such attacks do not consider aging of the devices that can cause parametric shift of device parameters over time. Device aging may potentially compromise device security. This project will investigate the the effects of device aging on the security of cryptographic devices.The goal of this project is to understand the aging-related risks that compromise security of cryptographic devices, particularly those with protection against physical attacks and develop solutions to ensure security when device aging comes into account. This project will focus on the following threats and investigate how aging can affect them: (i) The state-of-the-art side-channel analysis attacks; (ii) The state-of-the-art fault-injection attacks; and (iii) Hardware Trojans whose activation can be facilitated/hardened due to aging. It will target the shortcomings of these schemes and develop aging-resilient countermeasures to circumvent side-channel and fault-injection attacks. This project will also investigate aging-aware Trojan detection solutions.The success of this project will enable the development of long-lasting security for trusted hardware platforms, and result in aging-resistant security solutions that benefit the society via devices that remain secure over their lifetime. To attract graduate, undergraduate, and underrepresented students to hardware security and cryptography research and education, this project will develop a new course on cryptography, hardware security, and testing. Tutorials will be conducted and internships on hardware security will be offered to undergraduate students. This project will also seek to attract underrepresented minorities. Lectures on hardware security will be organized for Cristo Rey Jesuit high-school students. The project repository will be stored electronically and made available through the website hosted by the University of Maryland Baltimore County, department of Computer Science and Electrical Engineering (https://www.csee.umbc.edu/~nkarimi/). The data will be retained for a period of at least five years following the end of the grant period.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.
期刊论文(7)
专著(0)
科研奖励(0)
会议论文
On the Impact of Aging on Power Analysis Attacks Targeting Power-Equalized Cryptographic Circuits
老化对针对功率均衡密码电路的功率分析攻击的影响
DOI: --
发表时间: 2021
期刊: Proceedings of the ASPDAC Asia and South Pacific Design Automation Conference
影响因子: --
作者: [Anik, Md Toufiq, Fadaeinia, Bijan, Moradi, Amir, Karimi, Naghmeh]
通讯作者: Karimi, Naghmeh
DOI: 10.1109/vts56346.2023.10140057
发表时间: 2023
期刊: IEEE VLSI Test Symposium (VTS
影响因子: --
作者: [Bahrami, Javad, Ebrahimabadi, Mohammad, Danger, Jean-Luc, Guilley, Sylvain, Karimi, Naghmeh]
通讯作者: Karimi, Naghmeh
DOI: 10.1007/s10836-021-05976-8
发表时间: 2021-12
期刊: Journal of Electronic Testing
影响因子: --
作者: [Md Toufiq Hasan Anik;Mohammad Ebrahimabadi;J. Danger;S. Guilley;Naghmeh Karimi]
通讯作者: Md Toufiq Hasan Anik;Mohammad Ebrahimabadi;J. Danger;S. Guilley;Naghmeh Karimi
Leakage Power Analysis in Different S-Box Masking Protection Schemes
不同S-Box掩蔽保护方案中的泄漏功率分析
DOI: 10.23919/date54114.2022.9774763
发表时间: 2022
期刊: Automation and Test in Europe Conference (DATE
影响因子: --
作者: [Bahrami, Javad, Ebrahimabadi, Mohammad, Danger, Jean-Luc, Guilley, Sylvain, Karimi, Naghmeh]
通讯作者: Karimi, Naghmeh
共 7 条
    Student Travel Support for 2018 IEEE VLSI Test Symposium
    海外基金