Development of a fast and quantitative diffraction analysis of crystallite size distributions

提出了一种新的快速衍射方法来测定微晶尺寸分布（CSD）在材料科学中的应用。该方法是基于测量斑点Deby-Scherrer环通过X射线衍射使用二维探测器。将使用为此目的开发的Python开源代码以自动化方式分析单个衍射点。将使用在相同条件下测量的标准物质进行强度的绝对校准。该方法将适用于实验室和同步加速器X射线源，从而扩展了其他小组最近发表的工作的操作范围。此外，我们的方法将提供更准确的结果，因为将实施对光束不均匀性以及吸收效应的校正。该方法将被应用到多晶材料，研究再结晶和晶粒生长的影响，并承担了很大的，目前尚未开发的潜力，以更好地量化这些过程。

We propose a new fast diffractometric method to determine crystallite size distributions (CSDs) for applications in material science. The method is based on measurements of spotty Deby-Scherrer rings obtained by X-ray diffraction using two-dimensional detectors. The individual diffraction spots will be analyzed in an automated fashion using a Python open source code, developed for this purpose. The absolute calibration of the intensity will be done using a standard material measured under identical conditions. The method will be applicable to both laboratory and synchrotron X-ray sources and thus extends the operational range of recently published work by other groups. Moreover, what concerns the CSD determination our approach will deliver more accurate results as corrections for the beam inhomogeneity as well as absorption effects will be implemented. The method will be applied to polycrystalline materials to study the effects of recrystallisation and grain growth and bears a large and presently underexploited potential to better quantify these processes.