Analysis, Optimization, and Control of Scanning Atomic Force Microscope Micro-Cantilever Probes

原子力显微镜（AFM）被广泛用于检查比光学显微镜所能观察到的更小的样品。一个微小的“手指”，只有几个原子宽，在其最尖锐的点，是用来“感觉”样品的表面。该项目旨在通过主动控制传感器探针动力学来提高AFM图像的分辨率。 更高质量的AFM图像将使科学家能够进一步研究金属、聚合物、细胞和蛋白质等样品的原子和分子结构。 本研究将有助于澳大利亚制造的扫描探针显微镜的设计。发展当地的专门知识将为澳大利亚的科学和工业研究提供宝贵的资源。

Atomic Force Microscopes (AFM's) are widely used for the examination of samples smaller than can be observed with an optical microscope. A tiny 'finger', only a few atoms wide at its sharpest point, is used to 'feel' the surface of a sample. This project aims to increase the resolution of AFM images by actively controlling the sensor probe dynamics. Better quality AFM images would allow scientists to further investigate the atomic and molecular structure of such samples as: metals, polymers, cells, and proteins. This research will contribute to the design of an Australian made Scanning Probe Microscope. Development of local expertise will provide a valuable resource for Australian scientific and industrial research.