Phase retrieval and spectroscopy of atoms and molecules in/on graphene by advanced electron microscopy

该项目的目的是使用先进的透射电子显微镜技术对功能化石墨烯的局部原子和电子结构以及静电场进行成像和量化。这意味着，确定每个原子的位置和种类，并绘制石墨烯中/上的碳原子和功能物质附近的静电势，从而能够分别定量了解每个功能化位点的结构和性质，以及它们中的每一个如何对材料的整体性质做出贡献。 具体而言，石墨烯掺杂间隙原子和表面功能物种的特征在于使用电子全息技术，辅以分析电子显微镜技术。我们提出的研究将提供一个更详细的了解石墨烯的性质的变化及其结构的理解，通过其功能化。此外，我们的实验策略将导致在电子显微镜领域的综合表征方法，主要但不限于二维和辐射敏感材料。

The aim of this project is to image and quantify the local atomic and electronic structure and electrostatic fields of functionalized graphene using advanced transmission electron microscopy techniques. This means, determining the position and species of every atom, and mapping the electrostatic potential in the vicinity of the carbon atoms and the functional species in/on graphene, thus enabling a quantitative understanding of the structure and property of each functionalization site separately, and how each of them contributes to the overall properties of the material. Specifically, graphene doped with interstitial atoms and with surface functional species is to be characterised using electron holographic techniques, complemented by analytical electron microscopy techniques. Our proposed research will deliver a more detailed understanding about the change of the properties of graphene and its structural comprehension by its functionalization. Additionally, our experimental strategy will lead to an integrated characterization methodology in the field of electron microscopy primarily but not exclusively for two-dimensional and radiation sensitive materials.