Room-temperature near field microscope (RT-SNOM)

应用于室温近场显微镜允许记录近场光谱的频率范围内的太赫兹，红外和光学的横向分辨率在10和50 nm之间。该分辨率显著低于衍射极限，因此允许前所未有的实验进展。为此，除了主仪器外，还应用了CO2激光源以及包括宽带红外源的红外光谱仪。该宽带红外光源可附加用于并行应用的低温近场显微镜。为了在THz中进行测量，我们将利用低温近场显微镜框架内应用的源，而这需要升级。在为Weitz教授访问哥廷根提供基本资金的框架内，已经批准了为这一工具提供资金的可能性，这是建立该小组的一个重要工具。有了显微镜，我们将能够在现代固态研究领域进行各种高度创新的实验。例如，该工具将用于在双层石墨烯中定位拓扑保护状态，以允许其随后的电学表征，目的是例如研究它们与量子霍尔状态的相互作用。此外，我们正在计划用该仪器来可视化由二维聚合物和石墨烯组成的异质结构中的新型拓扑保护态。新仪器的另一个用例将在有机电子领域。该仪器的独特功能（包括定制的对称法布里-珀罗干涉仪）将允许首次对有机半导体薄膜中晶界处的局部光电流光谱进行纳米级调查，以可视化这些缺陷处的局部能垒。此外，在纳米级有机p/n结的局部形貌依赖的光电流测量将使我们能够在长期内提高有机太阳能电池的效率。

The applied for room-temperature near-field microscope allows to record near-field optical spectra in the frequency range of THz, infrared and optical with a lateral resolution between 10 and 50 nm. This resolution is significantly below the diffraction limit and thus allows unprecedented experimental progress. To this end, additionally to the main instrument, a CO2 laser source as well as an infrared spectrometer including a broad-band infrared source are applied for. The broad-band infrared source can additionally be used at the low-temperature near-field microscope applied for in parallel. To perform measurements in the THz, we will utilize the source applied for the in framework of the low-temperature near-field microscope, whereas this requires an upgrade. The funding possibility for this instrument has been granted in the framework of the basic funding for the call of Prof. Weitz to Göttingen, and is an essential tool for the building up of the group. With the microscope, we will be able to perform various highly innovative experiments in the area of modern solid-state research. For example, the tool will be used to localize topologically-protected states in bilayer graphene to allow their subsequent electrical characterization with the goal to e.g investigate their interplay with quantum-Hall states. Additionally, we are planning with the instrument to visualize novel topologically protected states in heterostructures composed of two-dimensional polymers and graphene. A further use-case of the novel instrument will be in the region of organic electronics. The unique capabilities of the instrument (which includes a customized symmetric Fabry-Perot interferometer) will allow the first-time nanoscopic investigations of local photocurrent spectroscopy at grain boundaries in organic semiconducting films to visualize local energy barriers at these defects. Furthermore, local morphology-dependent photocurrent measurements at nanoscopic organic p/n junctions will enable us to increase in the long run the efficiency of organic solar cells.