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DEVELOPMENT OF GRAZING-EXIT MICRO X-RAY FLUORESCENCE INSTRUMENT AND SINGLE PARTICLE ANALYSIS SUCH AS AEROSOLS

DEVELOPMENT OF GRAZING-EXIT MICRO X-RAY FLUORESCENCE INSTRUMENT AND SINGLE PARTICLE ANALYSIS SUCH AS AEROSOLS
放牧口微型X射线荧光仪及气溶胶等单颗粒分析的研制
批准号:
12554030
负责人:
TSUJI Kouichi
金额:
$8.77万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2000
资助国家:
日本
项目状态:
已结题
起止时间:
2000 至 2002

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相关文献

中文摘要
翻译
我们研究了放牧退出条件下的EPMA,称为GE-EPMA。我们在商用EPMA的基础上开发了GE-EPMA装置。我们评估了GE-EPMA的分析表征。在极低的背景下,GE-EPMA可以进行图像分析和单粒子分析。通过分析EPMA强度与出口角的关系,可以对薄膜的厚度和密度进行评价。GE-EPMA的优点是使用直径较小的电子束,入射角度为90度,这使得进行局部分析成为可能。可以通过扫描电子束或样品台来绘制元素图。此外,可以通过改变出口角度进行深度分析,最终得到三维EPMA
英文摘要
We have studied EPMA under grazing-exit conditions, which is called GE-EPMA. We developed a GE-EPMA apparatus based on a commericial EPMA. We evaluated the analytical characterization of GE-EPMA. It was foue analysis and single-particle analysis are possible by GE-EPMA with extremely low background. By analyzing exit-angle dependence of EPMA intensity, we can evaluate thickness and density of him films. The advantage of GE-EPMA is the use of an electron beam with a small diameter at an incident angle of 90 degrees, which makes it possible to perform localized analysis. Element mapping is possible by scanning the electron beam or the sample stage. In addition, depth analysis is possible by varying the exit angle, which could finally result in 3-dimensional EPMA
期刊论文(64)
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科研奖励(0)
会议论文
K. Tsuji, K. Wagatsuma: "Enhancement of TXRF Intensity by Using a Reflector"X-Ray Spectrom. 31. 358-362 (2002)
K. Tsuji、K. Wagatsuma:“使用反射器增强 TXRF 强度”X 射线光谱。
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通讯作者:
K.Tsuji et al.: "Continuous X-ray background in grazing-exit electron probe X-ray microanalysis"Spectrochim. Acta B. 56. 2497-2504 (2001)
K.Tsuji 等人:“掠射电子探针 X 射线微量分析中的连续 X 射线背景”Spectrochim。
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通讯作者:
Z. Solnik, K. Tsuji, etc: "Quantitative analysis of metallic ultra-thin films by grazing-exit electron probe x-ray microanalysis"X-Ray Spectrometry. 31. 178-183 (2002)
Z. Solnik,K. Tsuji等:“通过掠射电子探针X射线微量分析对金属超薄膜进行定量分析”X射线光谱法。
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共 28 条
    Development of fast XRF elemental imaging spectrometer
    • 批准号:
      26288069
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $10.98万
    • 财政年份:
      2014
    • 负责人:
      TSUJI Kouichi
    • 依托单位:
    Development of 3DXRF instrument and application to forensic science
    • 批准号:
      23350034
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $12.48万
    • 财政年份:
      2011
    • 负责人:
      TSUJI Kouichi
    • 依托单位:
    Small region XRF in-situ analysis of solid-liquid interface analysis
    • 批准号:
      19350042
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $11.32万
    • 财政年份:
      2007
    • 负责人:
      TSUJI Kouichi
    • 依托单位:
    Development of 3-D DX-ray Analytical Microscope and micro-nano analysis under actual environment
    • 批准号:
      15350048
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $9.66万
    • 财政年份:
      2003
    • 负责人:
      TSUJI Kouichi
    • 依托单位:
    海外基金