A study on the distribution and behavior of light elements in minerals and rocks

矿物和岩石大多为绝缘体，化学成分相当复杂。这些材料的这些基本性质给二次离子质谱仪(SIMS)在这些材料的化学分析中的应用带来了困难。在这项研究中，我们发展了实验和理论技术，用SIMS(Cameca 3f型)精确地定量分析矿物和岩石中的小原子序数的痕量元素，如氢、硼、氧等，并利用上述新技术进行了以下研究：(1)斑晶(辉石、斜长石、(2)利用SIMS对绝缘材料进行了简单的工作曲线法定量分析技术的发展。(3)利用SIMS对等离子体CVD合成的金刚石衬底中硼的分布进行了研究。(4)基于SIMS测量的扩散剖面数据，提出了一种结合等效边界板模型和位错管模型分析位错管半径的新方法。(5)利用SIMS建立了石英和石英玻璃中氢的定量微观分析(最低检测下限：lppm)。(6)^和lt的扩散剖面；用SIMS测量了黄长石单晶中的18&gt；O示踪剂，并结合位错在黄长石晶格中的扩散作用进行了分析.(7)用SIMS对标准岩样中的微量元素进行了定量的微量分析.(8)建立了同时测量氧化镁中晶格扩散系数和位错扩散系数的方法，该方法可以一次实验获得两个扩散系数.

The most of minerals and rocks are insulator and they have quite complicated chemical compositions. These basic characters of these materials bring on difficulty on the application of the secondary ion mass spectrometry (SIMS) for the chemical analysis of these materials. In this study, we have developed experimental and theoretical techniques for the precise quantitative analysis of the trace elements with small atomic number, such as hydrogen, boron, oxygen etc., in minerals and rocks using a SIMS (CAMECA 3f type), and the following studies have been carried out using the above new techniques.(1) Anion and cation partitioning coefficients between phenocrysts (pyroxenes, plagioclase, chrome spinel) and host magma were measured.(2) Development of techniques for the quantitative analysis of insulated materials by a simple working curve method was carried out using SIMS.(3) Analysis of the distribution of boron in the diamond substrate synthesized by plasma CVD was studied using the depth profiles by SIMS.(4) A new analytical method of dislocation pipe radius using combined equivalent boundary slab model and dislocation pipe model was developed based on the diffusion profile data measured by SIMS.(5) Quantitative micro analysis of hydrogen in quartz and quartz glasses (minimum detection limit : lppm) were developed using SIMS.(6) Diffusion profiles of ^<18>O tracer in single crystals of melilites were measured by SIMS, and were analysed in terms of diffusion in the melilite lattice together with a contribution from dislocations.(7) Quantitative micro analysis of the trace elements in the standard rock specimens were developed using SIMS.(8) Simultaneous measuring method of lattice and dislocation diffusion coefficients in MgO was developed and this method made possible to obtain two coefficients separately from one experimental run.