High resolution electron microscopy and atomic force microscopy of grain boundary and surface of minerals

1.在高分辨透射电子显微镜（HRTEM）中，富士胶片公司于1995年发明了一种新的成像板，并给出了用成像板进行高分辨成像的实验条件。研究了叶蛇纹石、云母粘土矿物、间层矿物、长石、磷灰石等矿物的精细结构和构造。电子敏感矿物，如叶蛇纹石和云母矿物不能通过使用常规照相胶片的聚焦图像获得。而成像干版比照相胶片具有更高的灵敏度，可获得这些矿物的透焦图像。2.在原子力显微镜（AFM）中，对热液成因的云母粘土矿物和高岭土矿物以及热丝CVD法合成的碳材料进行了研究，并对云母粘土矿物的接触方式和轻敲方式进行了对比研究。在两种模式下的高度图像中，仅在敲击模式下得到云母粘土矿物上的交错图案，呈螺旋状生长。而在接触模式的偏转图像和敲击模式的偏转和振幅图像中，获得了云母晶体上的交织图案，研究了CVD合成碳的习惯改变。除金刚石外，随着温度的降低，碳的形貌由球状聚集体、碳晶须、碳薄膜管等转变。对碳材料的AFM、SEM和TEM图像进行了详细的比较，指出AFM的分辨率较低，基底表面微米级的粗糙度会使AFM图像产生严重的伪影。

1.In high resolution transmission electron microscopy (HRTEM) characteristics of a new imaging plate, which was invented in 1995 by Fuji Photofilm Co., was investigated and experimental conditions for high resolution imaging using imaging plate were shown. Fine texture and structure of minerals, such as antigorite, mica clay minerals, interstratified minerals, feldspars and apatite were studied. Electron sensitive minerals, for example, antigorite and mica minerals were could not obtained through focus images using a conventional photographic film. Whereas through focus images of these minerals were obtained using imaging plate, which has higher sencitivity than photographic films. Now I research atomic resolution imaging for these minerals using by image processing in progress.2.In atomic force microscopy (AFM) mica clay minerals and kaolin minerals of hydrothermal origin and carbon materials syntesized by hot-filament CVD were investigated.A comparative study of contact mode and tapping mode was made for mica clay minerals. In the height images of both mode, only in tapping mode interlacing pattern on mica clay minerals, which show spiral growth, was obatinded. Whereas, in the deflection image of contact mode and deflection and amplitude image of tapping mode, interlacin patterns on mica crystals were obatined.Habit modification of carbon synthesized by CVD was investigated. Carbon, excepting for diamoned, changed their morphology from ball-like aggregate, carbon whisker, thin-film carbon tube with decreasing subsytate temperature. AFM,SEM and TEM image of carbon materials were compered in details and showed the low resosultion limits of AFM.Micrometer scale roughness on substrate give a serious artifacts in AFM image.