Imaging-ellipsometer

具有椭圆疏松测量功能的设备，包括测量成像以及在温度控制下与流体接触的选项，使其能够研究孔径分布、官能化和结构对分子吸附和解吸的影响，以及不同极性的蒸汽和与蒸汽或流体接触时在多孔膜上的膨胀行为。由于材料的数量很少，用其他方法很难做到这一点，而且没有沿着层厚度的同步局部信息(拟合模型)以及区域(成像)。这项技术不仅可以检测原本无法接触到的样品中的孔径分布，还可以研究润湿(功能化)或孔结构和传输或选择性蒸汽吸附的相互作用。例如，这对于下列研究是必要的：(I)薄膜/分离层(d~1微米到几纳米)中的孔尺寸分布的推导，以及通过纳米孔中聚合物的官能化或膨胀/蒸汽吸附来对其进行改性的研究，这些薄膜/分离层也具有沿薄膜厚度的不对称官能化和结构，ii)聚合物层和介孔层与蒸汽和温控液体接触的膨胀行为，iii)润湿影响和纳米尺度限制对蒸汽吸附和解吸的影响，例如在传输和分离过程的背景下。例如在运输和分离过程的背景下。尽管达姆施塔特大学的几个部门使用简单的椭偏仪来确定薄膜的层厚度和折射率，包括一种可以在空气中测量高达高温的设备，以及一些研究小组还可以对粉末进行蒸汽吸收，但无法研究薄的介孔和可膨胀的层以及因此非常少量的材料的孔尺寸分布以及它们作为功能化和结构属性的函数对不同极性蒸汽的吸湿行为。为了测量和评估吸附等温线，非常精确的分压设置和获得的测量数据的自动测量和评估是至关重要的。如果分压设置不精确，吸附和解吸曲线会重叠在一起，不可能得出结构-性质关系。此外，自动数据评估以确定孔大小分布对于有效测量非常重要。此外，对与流体接触的测量进行温度控制至关重要，特别是对于可膨胀和对温度敏感的表面。例如，温度控制的材料变化及其对运输或释放过程的影响变得可访问，因此结构-性质关系的推导成为可能。

A device with ellipsoporosimetry function including the option to measure imaging as well as in contact with fluids under temperature control makes it possible to investigate pore size distributions, the influence of functionalisation and structure on adsorption and desorption of molecules as well as of differently polar vapours and swelling behaviour in contact with vapours or fluids on thin porous films. Due to the small amount of material, this is hardly feasible with other methods and not with simultaneous local information along the layer thickness (fit models) as well as in the area (imaging). This technique allows not only to detect pore size distribution in otherwise inaccessible samples, but also to investigate the interaction of wetting (functionalisation) or pore structure and transport or selective vapour adsorption. This is, for example necessary for the following investigations: (i) derivation of the pore size distribution in thin films/ separating layers (d ~1 µm to a few nm) also with asymmetric functionalisation and structure along the film thickness, which are just being investigated for the alignment of transport processes, and their modification by functionalisation or swelling/vapour sorption of polymers in nanoscale pores, ii) Swelling behaviour of polymer layers and mesoporous layers in contact with vapours and temperature-controlled liquids, iii) Investigation of wetting influences and nanoscale confinement on vapour adsorption and desorption, e.g. in the context of transport and separation processes. e.g. in the context of transport and separation processes. Although several departments at the TU-Darmstadt use simple ellipsometers to determine the layer thickness and refractive index of thin films, including a device that can measure in air up to high temperatures, and a few research groups also perform vapour sorption on powders, there is no possibility to investigate thin mesoporous and swellable layers and thus very small amounts of material for their pore size distribution and their vapour sorption behaviour of differently polar vapours as a function of functionalisation and structural properties. In order to measure and evaluate sorption isotherms, the extremely precise setting of the partial pressure and the automated measurement and evaluation of the measurement data obtained are crucial. If the partial pressure setting is not precise, the adsorption and desorption curves lie on top of each other and it is not possible to derive structure-property relationships. Furthermore, automated data evaluation to determine the pore size distribution is important for efficient measurements. Furthermore, temperature control for measurements in contact with fluids is crucial, especially for swellable and temperature-responsive surfaces. For example, temperature-controlled material changes and their effect on transport or release processes become accessible and thus the derivation of structure-property relationships is possible.