Novel X-ray interferometer with a normal incidence and its applications

在这项研究中，我们的目的是设计和制作一种新型的不同光程长度的X射线干涉仪，并将其与具有纵向相干长度的核共振过滤X射线相结合。它由一组面对面排列的两片晶片组成，其中满足布拉格角接近pi/2的衍射条件。两个平板之间发生多次反射，导致干涉。核共振散射是一种理想的候选方法，其跃迁能为14.4keV。因此，经过核滤波的14.4keV X射线应满足正入射条件，并发现石英晶体的0.610反射是最好的。我们用同步辐射实现了这种新型的干涉仪。研究了石英晶体在垂直入射条件下的反射率和透射率。用新的正入射方法精确测定了石英晶体(0 6 10)的晶格参数，发现在95ﾟC下，经过核过滤的14 4keV X射线在pi/2处可实现布拉格反射。通过Si(12 4 0)和石英(0 6 10)平行设置来评价石英晶体的完整性。摇摆曲线的轮廓和地形告诉我们，它的完美是可取的。我们制作了Bonse-Hart型石英干涉仪，但没有观察到明显的干涉。切割工艺的改进可以使干涉成为可能。最后，从X射线光学的角度出发，提出了用该X射线干涉仪测定晶体因子位相的新方法，与其他方法有很大的不同。

In this research we aimed to design and making of a novel X-ray interferometer with different optical path lengths combined with a nuclear resonantly filtered X-ray which has a longitudinal coherence length. It composed of a set of two crystal plates arranged face to face in which the diffraction condition with a Bragg angle near pi/2 is satisfied. Multiple reflection is occurred between two plates and leads to the interference. The nuclear resonant scattering by the ^<57>Fe nuclei is a desirable candidate and its transition energy is 14.4 keV.So the nuclear filtered 14.4 keV X-ray should satisfy the normal incidence condition and we have found that 0 6 10 reflection by the quarts crystal is best for this purpose.We performed the fundamental experiments to realize this novel interferometer using the synchrotron radiation. The reflectivity and transivity of quartz 0 6 10 at the normal incidence condition was investigated. The lattice parameter of quartz (0 6 10) was precisely determined by the new normal incidence method and we found that the Bragg reflection just at pi/2 of the nuclear filtered 14.4 keV X-ray will be realized at 95ﾟC.The perfection of quartz crystal was evaluated by the parallel setting of Si (12 4 0) and quartz (0 6 10). The profile of the rocking curve and the topography told us that its perfection was desirable. We made Bonse-Hart type interferometer of the quartz but the clear interference was not observed. Improvement of the cutting process may enables the interference. Finally we proposed the new method which determine the phase of the crystal factor using this X-ray interferometer and is quite defferent from other methods from the view point of X-ray optics.