Spectroscopic Ellipsometer

奥格斯堡大学物理研究所实验物理IV主席在薄膜系统领域进行基础和应用研究。除其他外，这些包括有机半导体（例如用于显示应用的有机发光二极管），用于数据存储的磁性薄膜，用于热电或光电化学电池的复杂氧化物以及金刚石层。其中，光谱椭偏法在它们的光学特性中起着核心作用。它探测光穿透所研究材料的（多层）堆叠时偏振态的变化，并获得层厚度及其复折射率的重要信息。此外，它还提供了材料的光学各向异性信息，这些信息需要通过测量仪器和使用的分析软件来捕获。我们申请了一个新的光谱椭偏仪来代替一个20年的旧仪器，它不再是最先进的。椭偏仪对于我们小组进行各种薄膜系统的光学分析是至关重要的，这是我们研究的重点。具体来说，在这个提案中，我们计划解决有机半导体薄膜以及复杂的氧化物。这项技术的可用性对于获得和执行第三方资助的研究项目具有战略重要性，这在提案中有详细说明。

The Chair of Experimental Physics IV within the Institute of Physics at the University of Augsburg performs fundamental as well as applied research in the field of thin-film systems. These include, inter alia, organic semiconductors (e.g. organic light-emitting diodes for display applications), magnetic thin films for data storage, complex oxides for thermos-electrics or photo-electrochemical cells as well as diamond layers. Therein spectral ellipsometry plays a central role for their optical characterisation. It probes changes of the polarization state of light as it penetrates a (multi-)layer stack of the materials under study and yields important information on layer thicknesses and their complex refractive indices. Furthermore, it gives information on optical anisotropy of the materials, which needs to be captured by both the measurement instrumentation as well as the used analysis software. We apply for a new spectroscopic ellipsometer to substitute a 20-year old instrument, which is no longer state of the art. Ellipsometry is of fundamental importance for our group to perform optical analyses of a variety of thin films systems, which are in the focus of our research. Specifically, within this proposal we plan to address organic semiconducting thin films as well as complex oxides. The availability of this technique is of strategic importance for the acquisition and implementation of third-party funded research projects, as detailed in the proposal.