Time-resolved x-ray standing waves of ferroelectric ultra-thin film for a polarization measurement

我们成功地记录了来自氧化物衬底的非常窄的衍射谱，这意味着晶体衬底被认为是完美的晶体。从氧化物晶体的纳米结构和薄膜上观察到了由动态衍射效应引起的X射线驻波和衍射曲线。此外，我们发展了X射线衍射和极化的时间分辨测量，从而能够确定铁电薄膜的压电常数和电致伸缩系数。

We succeeded in recording very narrow profiles diffracted from oxide substrates, which means that the crystal substrates were regarded as perfect crystals. X-ray standing waves and diffracted curves caused by dynamical diffraction effects were observed from nanostructures and thin films on oxide crystals. In addition, we developed time-resolved measurements of x-ray diffraction and polarization enabled determination of the piezoelectric constants and electrostrictive coefficients of a ferroelectric film.