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Equivalence Checking for System-Level Designs Having Different Input-Output Timings

Equivalence Checking for System-Level Designs Having Different Input-Output Timings
具有不同输入输出时序的系统级设计的等效性检查
批准号:
23700051
负责人:
MATSUMOTO Takeshi
金额:
$2.33万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Young Scientists (B)
财政年份:
2011
资助国家:
日本
项目状态:
已结题
起止时间:
2011 至 2012

项目摘要

项目成果

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中文摘要
翻译
在这项工作中,嵌入式系统或VLSI的设计验证方法进行了研究。设计验证的目的是检查给定的设计是否正确,如果不正确,则提供失败模式。我们专注于两个设计的等价性检查。我们的验证目标是系统级设计,这是一个高度抽象的设计层次,并已成为近年来广泛应用。我们提出了等价性检查方法,可以处理给定的两个设计之间的不同的输入/输出时序。此外,我们还开发了一种方法来检测潜在的等效内部变量的设计。本文的目的是通过这些方法来提高系统级设计的等价性检验能力。
英文摘要
In this work, design verification methods for embedded systems or VLSIs are studied. The purpose of design verification is to check whether a given design is correct or not and provide failing patterns if incorrect. We focus on equivalence checking of given two designs. Our target of verification is system-level design, which is a highly abstracted design level and has become widely applied recently. We proposed equivalence checking methods that can deal with different input/output timings between given two designs. In addition, we have developed a method to detect potentially equivalent internal variables in designs. The purposed of this work is to improve the ability of equivalence checking for system-level designs by those proposed methods.
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会议论文
An Efficient Method to Localize and Correct Bugs in High-Level Designs Using Counterexamples and Potential Dependence
使用反例和潜在依赖来定位和纠正高层设计中的错误的有效方法
DOI: --
发表时间: 2012
期刊:
影响因子: --
作者: [Takeshi Matsumoto, Shohei Ono, Masahiro Fujita]
通讯作者: Masahiro Fujita
反例と設計分割に基づく高位設計に対する効率的な設計修正支援手法
基于反例和设计划分的高层设计高效设计修改支持方法
DOI: --
发表时间: 2011
期刊:
影响因子: --
作者: [原田裕基, 松本剛史, 藤田昌宏]
通讯作者: 藤田昌宏
An Efficient Method to Localize Correct Bugs in High-Level Designs Using Counterexamples and Potential Dependence
使用反例和潜在依赖性在高层设计中定位正确错误的有效方法
DOI: --
发表时间: 2012
期刊:
影响因子: --
作者: [T. Matsumoto, S. Ono, M. Fujita]
通讯作者: M. Fujita
SAT-based automatic rectification and debugging of combinational circuits with LUT insertions
基于SAT的带LUT插入的组合电路自动校正与调试
DOI: --
发表时间: 2014
期刊: IPSJ Transactions on System LSI Design Methodology
影响因子: --
作者: [S. Jo, T. Matsumoto, and M. Fujita]
通讯作者: and M. Fujita
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