Assessing image quality improvement of a new Scanning Probe Microscopy imaging mode.

Nanosurf是一家老牌但增长迅速的扫描探针显微镜制造商，该公司开发了一种新的表面成像模式，似乎既提高了成像分辨率，又延长了扫描期间使用的成像探针的寿命。由于这种显微镜正在进行原子尺度的工作，因此需要专门的设备来以可量化的方式监测这种变化。该项目的目的是通过与国家物理实验室(NPL)合作，以计量的方式测试这一观察结果，以便开发一种协议，以定量测量随着针尖磨损而发生的分辨率随时间的变化。

Nanosurf, an established but fast growing Scanning Probe Microscope manufacturer, has developed a new surface imaging mode that appears to both increase both imaging resolution and the lifespan of the imaging probes used during scanning. As this microscope is working down to the atomic scale specialized facilities would be required to monitor such changes in a quantifiable way. The aim of the project is to test this observation in a metrological manner, by partnering with the National Physical Laboratory (NPL) in order to develop a protocol to quantifiably measure resolution changes over time as the tip wears.