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Palladium electroplated tungsten semiconductor probes to minimise Palladium use in semiconductor test

Palladium electroplated tungsten semiconductor probes to minimise Palladium use in semiconductor test
电镀钯钨半导体探针可最大程度地减少半导体测试中钯的使用
批准号:
10064110
负责人:
金额:
$6.61万
依托单位:
依托单位国家:
英国
项目类别:
Collaborative R&D
财政年份:
2023
资助国家:
英国
项目状态:
已结题
起止时间:
2023 至 --

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中文摘要
翻译
TauProbes是为全球半导体测试市场提供半导体测试探头的唯一英国制造商。我们提供基于钨探头主体的测试探头。Innovate UK资助的项目将使TauProbes能够为我们的探测器尖端开发一种钯电镀工艺,以提高性能。这将使TauProbes能够生产世界上性能最好的半导体测试探测器,但只需使用当今市场上领先的高性能探测器中使用的昂贵钯的一小部分。探头技术从一开始就被设计为允许修复探针卡中损坏的探头;该项目将进一步扩展这一技术,以使磨损的探头能够重新铺设。探测器中大部分钯的去除将消除从俄罗斯进口这种材料用于半导体测试市场的需要。TauProbes是持续支撑半导体芯片制造和测试供应链的关键参与者,其在英国设计和制造的最先进的半导体测试探头。
英文摘要
TauProbes is the only UK manufacturer of semiconductor test probes for the global semiconductor test market. We offer test probes based on a tungsten probe body. The Innovate UK funded project will enable TauProbes to develop a Palladium plating process for the tips of our probes to enhance performance. This will enable TauProbes to produce the worlds most performant semiconductor test probes but with just a fraction of the expensive Palladium used in the leading high-performance probes on the market today. The probe technology has been designed from the start to allow damaged probes within a probe card to be repaired; this project will extend this further to enable the re-platting of worn probes. The removal of most of the Palladium in the probe will remove the need to import this material from Russia for the semiconductor test market. TauProbes is a key player in the on-going on-shoring of the semiconductor chip manufacture and test supply chain with its UK designed and manufactured state-of-the-art semiconductor test probe.
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