A triple beam microscope: new frontiers in materials nanocharacterisation

该项目旨在建立一个三束束离子和电子显微镜设施，用于修改、制备和表征迄今因过于敏感而无法用带电粒子束进行高分辨率分析的材料。预计将利用双离子束和新的探测器在纳米尺度上研究无伪影的材料，这些探测器允许新的成像模式和极高的化学灵敏度，以及可控制的大气传输到其他仪器进行相关测量。这一独特的设施将使许多学科的研究受益，如物理、化学、地质学、药学、材料、土木工程和化学工程，因为它可以首次观察不同材料中的重要现象。

This project aims to establish a triple beam ion and electron microscope facility for the modification, preparation and characterisation of materials that have hitherto been too sensitive for high resolution analysis with charged particle beams. It is expected that materials will be studied artefact-free and at the nanoscale with twin ion beams and new detectors that allow novel imaging modes and extreme chemical sensitivity plus controlled atmosphere transfer to other instruments for correlative measurements. This unique facility should benefit research in many disciplines such as physics, chemistry, geology, pharmacy, materials, civil and chemical engineering by allowing first-ever observations of vital phenomena in diverse materials.