WIDE-FIELD REFLECTION PHASE MICROSCOPY

这个子项目是利用资源的许多研究子项目之一。 由NIH/NCRR资助的中心拨款提供。对子项目的主要支持 子项目的首席调查员可能是由其他来源提供的， 包括美国国立卫生研究院的其他来源。为子项目列出的总成本可能 表示该子项目使用的中心基础设施的估计数量， 不是由NCRR赠款提供给次级项目或次级项目工作人员的直接资金。 本项目的目标是设计和研制一种基于低相干域干涉和离轴数字全息显微镜的广视场反射位相显微镜。相位显微镜的独特光学设计允许参考光束以一定角度与信号光束干涉，使得两束光束在整个视场中的路径长度相同。这导致了由高频空间条纹调制的采样相位的单次记录。最后，这些单炮干涉图可以被处理以确定相位，从而确定与所研究的表面相关的亚纳米运动。

This subproject is one of many research subprojects utilizing the resources provided by a Center grant funded by NIH/NCRR. Primary support for the subproject and the subproject's principal investigator may have been provided by other sources, including other NIH sources. The Total Cost listed for the subproject likely represents the estimated amount of Center infrastructure utilized by the subproject, not direct funding provided by the NCRR grant to the subproject or subproject staff. The goal of this project is to design and develop a wide-field reflection phase microscope based on low-coherence time-domain interferometry and off-axis digital holographic microscopy. The unique optical design of the phase microscope allows the reference optical beam to interfere with the signal beam at an angle in such a manner that the path length across the whole field of view is same for both the beams. This leads to single-shot recording of the sample phase modulated by high frequency spatial fringes. Finally, these single-shot interferograms can be processed to determine the phase and hence sub-nanometer motions associated with the surface under study.