Energy dispersive X-ray spectrometer for FIBSEM

我们正在为麦克马斯特大学最近购买的聚焦离子束扫描电子显微镜(FIB-SEM)请求能量色散X射线光谱分析(EDS)探测器。该分析附件对于分析必须为切片和随后的透射电子显微镜分析而准备的样品的化学成分是必不可少的。该工具包括用于元素映射和量化的软件，对于识别需要分析的物相、绘制感兴趣区域中元素的分布图以便能够识别需要研究的特定区域是必不可少的。几个研究小组将从所请求的仪器中受益。项目包括分析用于汽车应用和机械加工工具的涂层、合金中的氧化皮和氧化层、生物材料的界面、蒸汽发生器压力管中的涂层以及微结构的固化。该工具还将用于利用在测试微结构上获得的实验数据来开发和验证理论模型。如果没有这一要求的仪器，这项研究和在许多研究项目中的进展将受到严重限制，数据的可靠性将受到影响。预计将有10多个研究小组和大约40名研究生和博士后研究员受益于这一能力。

We are requesting an energy dispersive X-ray spectrometry (EDS) detector for our focused ion beam scanning electron microscope (FIB-SEM) recently purchased by McMaster University.  This analytical attachment is essential to enable the analysis of the chemical composition of samples that have to be prepared for sectioning and for subsequent transmission electron microscopy analysis.The tool which includes software for elemental mapping and quantification is indispensable for the identification of phases that need to be analysed, to map the distribution of elements in the areas of interest so that specific areas that need to be studied can be identified.Several research groups will benefit from the requested instrument. Projects include the analysis of coatings used for automotive applications and machining tools, scales and oxidation layers in alloys, interfaces in biomaterials, coating in pressure tubes in steam generators, and solidification of microstructures. This tool will also be used to develop and validate theoretical models with experimental data obtained on test microstructures. Without this requested instrument, this research and progress in numerous research projects will be severely limited and the reliability of the data will be compromised.It is expected that over 10 research groups and approximately 40 research students and postdoctoral fellows will benefit from this capability.