Exploring physical limits of electron beam characterization

电子显微镜（EM）的重要性随着纳米科学的重要性和新纳米材料的发展而增加。EM可以提供低于个位数纳米尺度的定量信息。最先进的EM为应用研究和开发带来了竞争优势，可以获得最新的EM分析。NINT的EM研究计划专注于显微镜的发展，可以提供实用的辐射敏感样品的定量数据。为了提高我们的分析能力，我们进一步开发了电子能量损失谱（EELS）分析、电子全息术和Zernike相板电子成像、电子断层扫描、低温TEM和纳米束衍射的物理基础。许多工业和学术客户和合作者目前受益于NINT EM开发的专业知识。 NINT EM不断吸引来自世界各地的顶级实验室的合作，进一步加强了我们实验室的声誉。我们的大部分核心研究由国家研究理事会/国家纳米技术研究所资助。NSERC的支持主要用于保留NINT电子显微镜的博士生培训方面。学生将从事的项目范围从电子散射和电子束引起的固体破坏的电子全息和价损失EELS的调查。

The importance of electron microscopy (EM) increases with the increasing importance of nanoscience and development of new nanomaterials. EM can provide quantitative information below single digit nanometer length scale. Cutting edge EM brings competitive advantage to application research and development with access to the newest EM analysis. The EM research program at NINT is focused on development of microscopy that can provide quantitative data on practical, radiation sensitive, samples. To improve our analytical capabilities, we further develop physics underlying electron energy loss spectroscopy (EELS) analysis, electron holography and Zernike phase plate imaging with electrons, electron tomography, cryo-TEM and nano-beam diffraction. Many industrial and academic clients and collaborators currently benefit from the expertize developed at NINT EM. NINT EM continuously attracts number of collaborations from top laboratories around the world further strengthening reputation of our laboratory. Most of our core research is funded by National Research Council / National Institute for Nanotechnology. The NSERC support serves primarily to retain the PhD student training aspect of the electron microscopy at NINT. The students will work on projects ranging from investigations of electron scattering and electron beam induced damage of solids to electron holography and valence loss EELS.