Exploring physical limits of electron beam characterization

随着纳米科学的日益重要和新的纳米材料的发展，电子显微镜(EM)的重要性日益增加。EM可以提供个位数纳米尺度以下的定量信息。尖端EM通过访问最新的EM分析为应用研究和开发带来竞争优势。NINT的EM研究计划专注于显微镜的发展，这种显微镜可以提供实用的、辐射敏感的样品的定量数据。为了提高我们的分析能力，我们进一步发展了电子能量损失谱(EELS)分析、电子全息术和电子泽尼克相板成像、电子层析、低温电子显微镜和纳米束衍射的物理基础。许多工业和学术客户和合作者目前受益于NINT EM开发的专家系统。NINT EM不断吸引来自世界各地顶尖实验室的合作，进一步巩固了我们实验室的声誉。我们的大部分核心研究是由国家研究委员会/国家纳米技术研究所资助的。NSERC的支持主要是为了保留NINT在电子显微镜方面的博士生培训。这些学生将从事从研究电子散射和电子束引起的固体损伤到电子全息术和价损失鳗鱼的一系列项目。

The importance of electron microscopy (EM) increases with the increasing importance of nanoscience and development of new nanomaterials. EM can provide quantitative information below single digit nanometer length scale. Cutting edge EM brings competitive advantage to application research and development with access to the newest EM analysis. The EM research program at NINT is focused on development of microscopy that can provide quantitative data on practical, radiation sensitive, samples. To improve our analytical capabilities, we further develop physics underlying electron energy loss spectroscopy (EELS) analysis, electron holography and Zernike phase plate imaging with electrons, electron tomography, cryo-TEM and nano-beam diffraction. Many industrial and academic clients and collaborators currently benefit from the expertize developed at NINT EM. NINT EM continuously attracts number of collaborations from top laboratories around the world further strengthening reputation of our laboratory. Most of our core research is funded by National Research Council / National Institute for Nanotechnology. The NSERC support serves primarily to retain the PhD student training aspect of the electron microscopy at NINT. The students will work on projects ranging from investigations of electron scattering and electron beam induced damage of solids to electron holography and valence loss EELS.