High-resolution imaging system for electron microscopy: software and hardware development

自Ernst Ruska和Max Knoll（约1930年）发明透射电子显微镜以来，少数公司专门从事透射电子显微镜的开发和制造，而其他公司则专注于制造外围设备。然而，这种趋势已经改变。如今，电子显微镜公司正试图控制其电子显微镜配件的成本和质量，为客户提供更具吸引力、更完整、更可靠的仪器，并提供集中支持。该提案与世界领先的高科技公司日立（Hitachi）合作，与滑铁卢大学（University of Waterloo）的超快电子成像实验室（UeIL）合作，该实验室专门从事最先进的仪器开发，以生产适合日立透射电子显微镜的专用电子检测系统。日立高科技拥有广泛的高科技产品组合，范围从分析系统，电子和原子力显微镜，半导体制造设备，以及各种各样的行业目标仪器，但电子检测相机。因此，该开发计划代表了UeIL和日立高科技加拿大公司之间协同合作的独特机会，以产生强大且具有成本效益的可伸缩电子检测设备。此外，这款新开发的电子相机将与“Maestro”完全集成，“Maestro”是日立高科技开发的中央计算机平台，用于控制日立电子显微镜中的所有辅助设备。

Since its invention by Ernst Ruska and Max Knoll (ca. 1930), a handful of companies specialized in the development and fabrication of transmission electron microscopes, whereas others focused on manufacturing peripheral devices. However, this trend has changed. Nowadays, electron microscopy companies are trying to gain control on the cost and quality of their electron microscope accessories to offer customers a more attractive, complete, and reliable instrument with centralized support.This proposal partners Hitachi, a world-leading High Tech company, with the Ultrafast electron Imaging Lab (UeIL) at the University of Waterloo, a laboratory that specializes in state-of-the-art instrumentation development, to produce an exclusive electron detection system designed to suit Hitachi transmission electron microscopes. Hitachi High Technologies has a wide portfolio of high-tech products that range from analytical systems, electron and atomic force microscopes, semiconductor manufacturing equipment, and a large variety of industry-targeted instruments but electron detection cameras. This development plan therefore represents a unique opportunity to synergize collaborative work between UeIL and Hitachi High Technologies Canada Inc. to generate a robust and cost effective retractable electron detection device. Furthermore, this newly developed electron camera will be fully integrated with "Maestro": a centralized computer platform developed by Hitachi High Technologies to control all auxiliary devices in Hitachi electron microscopes.