Low Current Scanning Electrochemical Microscope for Reactive Imaging of Energy and Structural Materials

我们正在申请紧急更换低电流扫描电化学显微镜。这款高端电化学显微镜（HEKA ELProScan 1）于2012年由CFI-JELF授予Mauzeroll，并已被NSERC资助的Discovery，Strategic和CRD赠款中的所有当前co-PI广泛使用。多个其他NSERC资助的团体使用麦吉尔化学（教授）所要求的替代品。Sleiman，Thibodeau，Lumb，Blum）和工程（Kietzig教授），其他大学（教授。Masson UdeM、Moreau Concordia、Bélanger UQAM、Yung首尔国立大学）和工业（魁北克水电、NRC和通用汽车）。这一要求的紧迫性基于两个事实。(i)带有ECS 3电机控制器的Z-piezo能够在显微镜中实现微电极的高分辨率移动，在两年内已经被运回两次进行维修，并且已经到了使用寿命的尽头（由HEKA确定）。再加上恒电位仪电流不稳定以及载物台导轨和轴承的腐蚀，我们目前无法达到使用微电极和微量移液器（直径<1 µm）所需的高分辨率运动和电流。这是一个关键的能力，只有在加拿大的几所大学提供，正在进行的实验限制影响已经开始的博士项目。(ii)申请人（Mauzeroll）和共同申请人（Brochu、Bocher、Chromik和Schougaard）的现有NSERC研究项目要求测量fA-pA级电流和5 nm横向分辨率。虽然有几种仪器可以分别进行低电流测量和纳米形貌成像，但桥接这两种测量需要使用所需的扫描电化学显微镜。目前，这些测量是在Mauzeroll的第二台较新的仪器上完成的，就现有用户而言，这台仪器的使用量过大。考虑到在我们的NSERC资助的项目中研究的合金和催化剂的产量不断增长，以及这些测量在HQP培训中的作用，我们必须在麦吉尔大学更换这种研究工具。 该请求将使我们能够继续对各种样品（合金，涂层，催化剂材料）和尺寸尺度（5 nm-15 mm）进行定量测量，这些样品和尺寸尺度由2012年CFI原始奖资助，并将通过达到较低的电流水平来提高4个NSERC资助赠款的研究能力。这些测量对于催化剂和耐腐蚀材料的开发至关重要。该文书将继续向整个学术界开放。

We are applying for an urgent replacement of the low-current scanning electrochemical microscope. This high-end electrochemical microscope (HEKA ELProScan 1) was acquired in 2012 with a CFI-JELF grant to Mauzeroll and has been used extensively by all current co-PIs in NSERC funded Discovery, Strategic and CRD grants. Multiple other NSERC funded groups use the requested replacement at McGill chemistry (Profs. Sleiman, Thibodeau, Lumb, Blum) and engineering (Prof. Kietzig), other universities (Profs. Masson UdeM, Moreau Concordia, Bélanger UQAM, Yung Seoul National University) and industries (Hydro-Quebec, NRC and General Motors). The urgency of this request is based on two facts. (i) The Z-piezo with ECS3 motor controller enabling the high-resolution movement of the microelectrodes in the microscope has been shipped back twice in two years for repair and is at the end of its life (as determined by HEKA). In combination with potentiostat current instabilities and the corrosion of the stage rails and bearings, we are currently unable to reach the high-resolution motions and currents needed for us to work with our microelectrodes and micropipettes (<1 µm diameter). This is a critical capability that is only available at a few universities in Canada, and the ongoing experimental limitations affects the already started PhDs projects. (ii) The existing NSERC research projects of the applicant (Mauzeroll) and co-applicants (Brochu, Bocher, Chromik and Schougaard) require the measurements of fA-pA level currents and 5 nm lateral resolution. While there are several instruments allowing low current measurements and nm topographical imaging separately, bridging the two measurements requires the use of the requested scanning electrochemical microscope. At the moment, these measurements are done on Mauzeroll's second newer instrument, which is overextended in terms of existing users. Considering the growing throughput of alloys and catalysts studied in our NSERC funded projects and the role of such measurements in HQP training, we must replace this research tool at McGill. The request will allow us to continue the quantitative measurements across the variety of samples (alloys, coatings, catalyst materials) and size scales (5nm-15mm) as funded by the original 2012 CFI award and will enhance the research capability of 4 NSERC funded grants by reaching lower current levels offered by the newer model, which are required for our forthcoming scanning nanopipette studies described below. These measurements are critical for the development of catalyst and corrosion resistant materials. The instrument will continue to be accessible to the whole academic community.