An Efficient Degraded Deductive Fault Simulator for Small-Delay Defects
An Efficient Degraded Deductive Fault Simulator for Small-Delay Defects
复制标题
针对小延迟缺陷的高效降级演绎故障模拟器
DOI:
10.1109/access.2020.3037292
复制
发表时间:
2020
期刊:
影响因子:
3.9
通讯作者:
Cai Shuo
中科院分区:
文献类型:
--
作者:
Liu Tieqiao;Yu Ting;Wang Shuo;Cai Shuo
An efficient degraded deductive simulator for small delay defects is proposed. The proposed method takes into account the conditions of re-convergence sensitization and hazard-based detection, providing fast and accurate simulation results for small delay defects. Separate simulation strategies for faults with different fault effects are proposed. For faults on fault effects re-convergent fan-out stems, the serial simulation technique is applied. For other faults, a deductive simulation technique is proposed to accelerate the simulation. Different from previous works, serial simulations are carried out no longer for all faults on fan-out re-convergent stems, but only for fault effects re-convergences, and the other faults are parallel simulated with the degraded deductive technique, which eliminates “AND” operation and the propagation of fault-list is simpler than conventional deductive ones. Experimental results demonstrate that the proposed simulator that can further accelerate the fault simulation in efficiency. It achieves a 28.3X speedup on average compared with the serial simulation method, and a 3.92X speedup on average compared with the critical path tracing based method.
登录
查看更多内容
DOI:
10.1109/tcad.2016.2598560
发表时间:
2017-05
影响因子:
2.9
作者:
E. Schneider;M. Kochte;S. Holst;X. Wen;H. Wunderlich
通讯作者:
E. Schneider;M. Kochte;S. Holst;X. Wen;H. Wunderlich
DOI:
10.1109/vlsic.2010.5560326
发表时间:
2010-06
期刊:
2010 Symposium on VLSI Circuits
影响因子:
--
作者:
Young Moon Kim;Y. Kameda;Hyunki Kim;M. Mizuno;S. Mitra
通讯作者:
Young Moon Kim;Y. Kameda;Hyunki Kim;M. Mizuno;S. Mitra
DOI:
10.1109/ets.2008.19
发表时间:
2008-05
期刊:
2008 13th European Test Symposium
影响因子:
--
作者:
A. Czutro;N. Houarche;P. Engelke;I. Polian;M. Comte;M. Renovell;B. Becker
通讯作者:
A. Czutro;N. Houarche;P. Engelke;I. Polian;M. Comte;M. Renovell;B. Becker
DOI:
10.1145/1120725.1120856
发表时间:
2005-01
期刊:
Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005.
影响因子:
--
作者:
Yasuo Sato;S. Hamada;T. Maeda;Atsuo Takatori;S. Kajihara
通讯作者:
Yasuo Sato;S. Hamada;T. Maeda;Atsuo Takatori;S. Kajihara
DOI:
10.1109/itc.2004.128
发表时间:
2004-10
期刊:
2004 International Conferce on Test
影响因子:
--
作者:
B. Kruseman;A. Majhi;G. Gronthoud;S. Eichenberger
通讯作者:
B. Kruseman;A. Majhi;G. Gronthoud;S. Eichenberger