Watermarked ReRAM: A Technique to Prevent Counterfeit Memory Chips

Watermarked ReRAM: A Technique to Prevent Counterfeit Memory Chips
复制标题

带水印的 ReRAM:一种防止假冒存储芯片的技术

DOI:
10.1145/3526241.3530341
复制
发表时间:
2022
期刊:
Proceedings of the Great Lakes Symposium on VLSI 2022
影响因子:
--
通讯作者:
Rahman, Md Tauhidur
Rahman, Md Tauhidur
中科院分区:
--
文献类型:
--
作者:
Ferdaus, Farah;Bahar Talukder, Bashir Mohammad;Rahman, Md Tauhidur

文献摘要

参考文献

相似文献

电子伪造是一个长期存在的问题,对许多部门产生长期不利影响,而且仍在增加。本文提出了一种新型的低成本技术,通过切换(设置/重置)操作操纵其模拟物理特性,在具有阻性RAM(ReRAM)的设备中嵌入水印,以防止伪造。我们开发了一个系统级框架来控制存储单元的物理特性,以便将不可逆水印压印到商业ReRAM中,这些ReRAM将通过感测单元物理特性的变化来检索。实验结果表明,我们提出的ReRAM水印是对温度变化的鲁棒性和可接受的快速~0.6bit/min的印记和~15.625bits/s的检索率。
Electronic counterfeiting is a longstanding problem with adverse long-term effects for many sectors, remaining on the rise. This article presents a novel low-cost technique to embed watermarking in devices with resistive-RAM (ReRAM) by manipulating its analog physical characteristics through switching (set/reset) operation to prevent counterfeiting. We develop a system-level framework to control memory cells' physical properties for imprinting irreversible watermarks into commercial ReRAMs that will be retrieved by sensing the changes in cells' physical properties. Experimental results show that our proposed ReRAM watermarking is robust against temperature variation and acceptably fast with ~0.6bit/min of imprinting and ~15.625bits/s of retrieval rates.
DOI: --
发表时间: 2020
期刊: 2020 IEEE International Symposium on Hardware Oriented Security and Trust (HOST
影响因子: --
作者:
Bahar Talukder, B. M.;Menon, Vineetha;Ray, Biswajit;Neal, Tempestt;Rahman, Md Tauhidur
通讯作者: Rahman, Md Tauhidur
DOI: 10.1109/ted.2020.3015451
发表时间: 2020
影响因子: 3.1
作者:
S. Sakib;A. Milenković;B. Ray
通讯作者: B. Ray
阻变随机存取存储器(RRAM)的最新进展
DOI: --
发表时间: 2012
期刊: IEEE Silicon Nanoelectronics Workshop
影响因子: --
作者:
Yi Wu;Shimeng Yu;X. Guan;H. Wong
通讯作者: H. Wong
基于SRAM PUF和公钥密码技术的芯片到芯片认证方法
DOI: 10.1007/s41635-019-00080-y
发表时间: 2019
期刊: Journal of Hardware and Systems Security
影响因子: --
作者:
I. Karageorgos;Mehmet Meric Isgenc;S. Pagliarini;L. Pileggi
通讯作者: L. Pileggi
DOI: 10.1109/jproc.2014.2332291
发表时间: 2014-08-01
影响因子: 20.6
作者:
Guin, Ujjwal;Huang, Ke;Makris, Yiorgos
通讯作者: Makris, Yiorgos