Effective lateral stiffness enhancement of high-aspect-ratio carbon nanotube probe

Effective lateral stiffness enhancement of high-aspect-ratio carbon nanotube probe
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高纵横比碳纳米管探针的有效横向刚度增强

DOI:
10.1504/ijnm.2013.052885
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发表时间:
2013-03
影响因子:
--
通讯作者:
Lihua Xu
Lihua Xu
中科院分区:
--
文献类型:
--
作者:
Haifeng Gao;Zongwei Xu;Lihua Xu

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本文以大长宽比碳纳米管(CNT)原子力显微镜探针为例,系统研究了图像伪影的产生机理。利用扫描电子显微镜在线纳米操纵技术研究了碳纳米管的形成机理,提出了靶向电子束诱导沉积铂的策略,在不影响碳纳米管表面形貌优势的前提下,提高了碳纳米管探针的横向硬度。该技术有效地避免了图像伪影的产生,优化了沉积剂量和沉积模型等工艺参数。此外,利用性能增强型碳纳米管探头的优异性能对聚焦离子束球磨技术制备的典型结构进行了扫描,发现碳纳米管探头可以获得比硅探头大20°的理想梯度值。
This article systematically studied the generation mechanism of image artefacts in the case of the high-aspect-ratio carbon nanotube (CNT) atomic force microscopy probe. The scanning electronic microscope online nanomanipulation technology was used to investigate the generation mechanism then the strategy of site-specified electron beam induced deposition of platinum was proposed to enhance the lateral stiffness of CNT probes without obvious morphology advantage degradation. This technology was found effective for avoiding the image artefacts and technical parameters including the deposition dose and deposition model were optimised. Also, the outstanding performance of property-enhanced CNT probes were used to scan the typical structures fabricated by focused ion beam milling technology, it was found the CNT probes could achieve the ideal gradient values which could be 20° larger than that of Si probe.
原子力显微镜中碳纳米管探针的制造和配置
DOI: 10.1016/j.cirp.2009.03.088
发表时间: 2009
期刊: CIRP Annals - Manufacturing Technology
影响因子: --
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