Primary investigation the impacts of the external memory (DDR3) failures on the performance of Xilinx Zynq-7010 SoC based system (MicroZed) using laser irradiation

Primary investigation the impacts of the external memory (DDR3) failures on the performance of Xilinx Zynq-7010 SoC based system (MicroZed) using laser irradiation
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使用激光照射初步研究外部存储器 (DDR3) 故障对基于 Xilinx Zynq-7010 SoC 的系统 (MicroZed) 性能的影响

DOI:
10.1016/j.nimb.2017.04.053
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发表时间:
2017-09
期刊:
Nuclear Inst. & Methods in Physics Research, B
影响因子:
--
通讯作者:
Lawal Olarewaju Mubashiru
Lawal Olarewaju Mubashiru
中科院分区:
其他
文献类型:
--
作者:
Shuhuan Liu;Xuecehng Du;Xiaozhi Du;Lawal Olarewaju Mubashiru

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