Study on the electroluminescence properties of diodes based on n-ZnO/p-NiO/p-Si heterojunction

Study on the electroluminescence properties of diodes based on n-ZnO/p-NiO/p-Si heterojunction
复制标题

n-ZnO/p-NiO/p-Si异质结二极管电致发光性能研究

DOI:
10.1016/j.optcom.2014.09.021
复制
发表时间:
2015-02
影响因子:
2.4
通讯作者:
Du Guotong
Du Guotong
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Zhao Yang;Wang Hui;Wu Chao;Li Wancheng;Gao Fubin;Wu Guoguang;Zhang Baolin;Du Guotong

文献摘要

参考文献

被引文献

相似文献

我们采用金属有机化学气相沉积(MOCVD)结合射频(RF)磁控溅射技术制造了由n-ZnO/p-NiO/p-Si异质结构组成的发光二极管(LED)。这些器件表现出类似二极管的整流电流-电压特性,开启电压为 6.8 V。在正向偏压下,在室温下观察到明显的宽发射峰值,峰值约为 400-650 nm。不对称电致发光 (EL) 光谱由两个表观带组成,分别位于 420 和 495 nm 处,对应于紫色和绿色发光。此外,还根据异质结的能带图初步讨论了发光机理。
We fabricated the light-emitting diodes (LEDs) consisting of n-ZnO/p-NiO/p-Si heterostructure by using metal-organic chemical vapor deposition (MOCVD) combined with radio frequency (RF) magnetron sputtering. The devices exhibited diode-like rectifying current–voltage characteristics and had a turn-on voltage of 6.8 V. Under forward bias, a prominent broad emission peaked around 400–650 nm was observed at room temperature. The asymmetric electroluminescence (EL) spectra were consisted of two apparent bands, which located at 420 and 495 nm corresponding to the violet and green luminescence, respectively. Furthermore, the mechanism of the light emission was tentatively discussed in terms of the band diagrams of the heterojunction.
DOI: 10.1186/1556-276x-8-320
发表时间: 2013-07-13
影响因子: --
作者:
Abbasi MA;Ibupoto ZH;Hussain M;Nur O;Willander M
通讯作者: Willander M
DOI: 10.1063/1.3232244
发表时间: 2009-09
影响因子: 4
作者:
Jennifer Wang;Chun-Yu Lee;Yungting Chen;Chung-Tse Chen;Yung-Ling Chen;Ching-Fuh Lin;Y. Chen
通讯作者: Jennifer Wang;Chun-Yu Lee;Yungting Chen;Chung-Tse Chen;Yung-Ling Chen;Ching-Fuh Lin;Y. Chen
DOI: 10.1063/1.337504
发表时间: 1986-12
影响因子: 3.2
作者:
J. Cordaro;Y. Shim;J. E. May
通讯作者: J. Cordaro;Y. Shim;J. E. May
DOI: 10.1063/1.2201895
发表时间: 2006-05-01
影响因子: 4
作者:
Ye, JD;Gu, SL;Zheng, YD
通讯作者: Zheng, YD
DOI: 10.1038/nmat1284
发表时间: 2005-01-01
期刊: NATURE MATERIALS
影响因子: 41.2
作者:
Tsukazaki, A;Ohtomo, A;Kawasaki, M
通讯作者: Kawasaki, M