Effect of annealing on the structure and magnetic properties of Co2FeAl0.5Si0.5 thin films on Ge(111)
Effect of annealing on the structure and magnetic properties of Co2FeAl0.5Si0.5 thin films on Ge(111)
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退火对Ge(111)基Co2FeAl0.5Si0.5薄膜结构及磁性能的影响
DOI:
10.1016/j.jallcom.2018.03.075
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发表时间:
2018
影响因子:
6.2
通讯作者:
Achinuq B
中科院分区:
文献类型:
--
作者:
Achinuq B
We present a magnetic and structural properties study of epitaxially grownB2-ordered full Heusler Co2FeSi0.5Al0.5single crystal films on Ge(111) substrates, as a function of annealing temperature. Hysteresis loop measurements reveal that the magnetic properties of Co2FeSi0.5Al0.5are stable up to 450 °C while ferromagnetic resonance linewidth measurements show a reduction of Gilbert damping from 5.6 × 10−3to 2.9 × 10−3for as-grown and annealed film, respectively. Above 500 °C, the films have increased coercivity, decreased saturation magnetisation, and show characteristic two-magnon scattering resonance line-shapes. Magnetic inhomogeneities developed within the film when annealed above 500 °C were correlated to significant interdiffusion at the film-substrate interface, as confirmed by scanning transmission electron microscopy and electron energy loss spectroscopy. By performing first-principles calculations based on atomistic models developed from atomically-resolved microscopy images, we show the magnetic moment of the Co2FeSi0.5Al0.5film reduces upon Co substitution by Ge atoms.
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通讯作者:
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